Polyaminoamide Copper Plating Bath for Void-Free Feature Filling

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Solution Overview

Problem

There is a need for an acidic copper electroplating bath that produces copper deposits with good morphology, low roughness, and improved uniformity in height, particularly for filling recessed features on the micrometer scale without forming defects like voids.

Innovation Solution

The use of cationic aminoamide polymers as leveling agents in the copper electroplating composition, which includes copper ions and an acid, provides extraordinary leveling properties, ensuring uniform and planar copper deposits in recessed features.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional leveling agents are used in copper electroplating, then copper deposits can be formed, but the deposits exhibit high roughness and poor uniformity in height

Engineering Contradiction:
Improveuniformity in height of copper depositsVSAvoidroughness of copper deposits
Core Design Contradiction:
Manufacturing precisionVSShape

Solution Approach 1:

The patent changes the chemical parameters of the leveling agent by using polyaminoamide polymers with specific molecular weights (1,000-100,000 g/mol) and nitrogen contents (10-40%), which fundamentally alters the deposition characteristics to achieve smooth, uniform copper deposits with reduced roughness and improved height uniformity

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent employs composite additive systems combining polyaminoamide leveling agents with other electroplating additives (accelerators, suppressors, brighteners) to achieve synergistic effects that simultaneously control deposition rate, surface morphology, and uniformity across varying current densities

Inventive Principle:
Principle #40Composite materials

2Manufacturing precision

If copper electroplating is performed to fill recessed features, then copper deposits are formed, but voids and defects are generated in the deposited layer

Engineering Contradiction:
Improvefilling quality of recessed featuresVSAvoidvoids and defects in copper deposits
Core Design Contradiction:
Manufacturing precisionVSObject-generated harmful factors

Solution Approach 1:

The patent applies local quality control by using polyaminoamide leveling agents that selectively adsorb at different locations (recessed features vs. planar surfaces) with different adsorption densities, enabling bottom-up filling of recesses while maintaining uniform deposition across the entire substrate and preventing void formation

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent implements preliminary action by pre-adsorbing polyaminoamide polymers onto the substrate surface before copper deposition begins, creating a controlled interface that guides subsequent copper ion reduction and ensures defect-free filling of recessed features from the outset

Inventive Principle:
Principle #10Preliminary action

3Manufacturing precision

If polyaminoamide leveling agents are used to achieve uniform deposition, then coplanarity and surface quality improve, but the plating process complexity increases

Engineering Contradiction:
Improvecoplanarity of copper bumpsVSAvoidcomplexity of plating composition
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent achieves universality by designing polyaminoamide polymers that simultaneously perform multiple functions: leveling, smoothing, void prevention, and uniformity control across different feature geometries (bumps, recesses, vias), eliminating the need for multiple specialized additives and simplifying the overall process

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The described composition achieves improved coplanarity of plated copper bumps, low roughness, and void-free filling of recessed features, enhancing the reliability and efficiency of the electroplating process.

Implementation Method 1

copper is deposited by copper electroplating on the exposed surface of the seed layer in the openings to thereby form copper bumps

Methodology Applied
Scientific EffectElectroplating: Electroplating

Data Source

PatentUS20250129503A1Composition for copper electrodeposition comprising a polyaminoamide type leveling agent
Publication Date: 2025.04.24 BASF SE
  • US20250129503A1 patent drawing
  • US20250129503A1 patent drawing
  • US20250129503A1 patent drawing

AI summary

Described herein is a copper electroplating composition including copper ions, an acid, and at least one polyaminoamide including a group of formula L1[B-A-B′—Z]n[Y—Z]m  (L1)that is obtainable by reacting a diamine compound including two primary or secondary amino groups with an amino acid in a molar ratio of approx. 1:2 to form an aminoamide compound that is afterwards reacted with a coupling agent and optionally with a diamine co-monomer.