Polygon Mirror Light Scanning for Uniform Wide-Angle Printing
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Solution Overview
Problem
Conventional light scanning apparatuses face challenges in downsizing while maintaining high-speed and high-quality image recording, with issues such as increased size, cost, driving noise, vibration, and non-uniform printing due to variations in spot diameter and light amount, especially when wide-angle scanning is attempted.
Innovation Solution
The light scanning apparatus employs a split stop type with an anamorphic collimator lens and a polygon mirror, utilizing a split stop configuration and a synchronization detection system to optimize light flux distribution and synchronization detection, reducing the size and cost while ensuring uniform printing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Volume of moving object
If the width of incident light flux is made smaller than the deflecting surface width (UFS type), then the apparatus can be downsized, but non-uniform printing occurs due to variations in spot diameter and light amount
Solution Approach 1:
The patent applies local quality by making the light flux width vary at different positions along the deflecting surface. Specifically, the light flux width is made larger at the outer peripheral portions of the deflecting surface and smaller at the central portion, which compensates for the natural decrease in light amount at outer positions and achieves uniform printing across the entire scanning area while maintaining a compact apparatus size
2Volume of moving object
If wide-angle scanning is implemented to reduce apparatus size, then the apparatus volume decreases, but synchronization detection accuracy deteriorates
Solution Approach 1:
The patent applies parameter changes by optimizing the scanning angle to be 25 degrees or more, which provides a balance between apparatus downsizing and maintaining sufficient synchronization detection accuracy. Additionally, the light flux distribution is specifically designed to ensure adequate light reaches the synchronization detection sensor even at wide scanning angles
3Manufacturing precision
If the light flux width is increased to improve light amount distribution, then printing uniformity improves, but the apparatus size increases
Solution Approach 1:
Rather than uniformly increasing the light flux width across the entire deflecting surface, the patent applies local quality by selectively increasing the light flux width only at the outer peripheral portions where light amount naturally decreases. This targeted approach achieves printing uniformity without requiring a proportional increase in overall apparatus size
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution achieves downsizing with high-speed and high-quality image recording by minimizing the difference in optical characteristics and light flux distribution, reducing the size and cost of the apparatus, and improving synchronization detection accuracy.
Implementation Method 1
an anamorphic collimator lens and a polygon mirror, utilizing a split stop configuration
Implementation Method 2
a deflecting unit configured to deflect a light flux from a light source to scan a surface in a main scanning direction
Implementation Method 3
polygon mirror
Implementation Method 4
a first optical system configured to guide the light flux deflected by the deflecting unit to the surface to be scanned
Data Source
AI summary
A light scanning apparatus according to the present disclosure includes a deflecting unit configured to deflect a light flux from a light source to scan a surface in a main scanning direction, and a first optical system configured to guide the light flux deflected by the deflecting unit to the surface to be scanned, in which a width of the light flux immediately before being incident on a first deflecting surface of the deflecting unit is smaller than a width of the first deflecting surface in a main scanning cross section, and only a part of the light flux incident on the deflecting unit is deflected toward the surface to be scanned by the first deflecting surface when the first deflecting surface is at a first angle in the main scanning cross section.