Polygonal Spherical Sampling Device Static Probe Array
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Solution Overview
Problem
Current spherical near-field measurement techniques rely on mechanical turntables, resulting in low test efficiency and precision due to mechanical rotation requirements, limited weight capacity, and complex structures.
Innovation Solution
A polygonal spherical space sampling device with probes distributed in a three-dimensional spherical space, eliminating the need for a turntable by using electrically controlled switching, allowing for static testing and increased precision, and accommodating heavier objects with a simpler structure.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a mechanical turntable is used to rotate the object being tested, then spherical space sampling data can be obtained, but test efficiency is reduced due to mechanical rotation requirements
Solution Approach 1:
The patent replaces the mechanical turntable system with a fixed probe array system. Multiple probes are distributed in three-dimensional spherical space around the object being tested, and electrical switching is used to activate different probes for omnidirectional sampling. This eliminates mechanical rotation while maintaining measurement capability, thereby improving test efficiency.
Solution Approach 2:
The patent transitions from a two-dimensional planar sampling approach to a three-dimensional spherical sampling approach. Probes are arranged in multiple vertical planes at different heights, creating a spherical distribution that enables comprehensive omnidirectional measurement without requiring mechanical rotation of the test object.
2Ease of operation
If a mechanical turntable is used for sampling, then rotation can be achieved, but test precision is affected by turntable rotation precision uncertainty
Solution Approach 1:
The patent eliminates the mechanical turntable entirely and replaces it with a fixed probe array system. The probes are stationary and positioned at known locations in three-dimensional spherical space, eliminating the precision uncertainties associated with mechanical rotation while maintaining the ability to perform omnidirectional sampling through electrical switching.
3Adaptability or versatility
If a turntable structure is used, then sampling can be performed, but the device structure becomes complex and volume increases
Solution Approach 1:
The patent extracts and removes the complex mechanical turntable subsystem from the sampling device. Instead of using a rotating platform, the design employs a fixed array of probes distributed in spherical space, significantly simplifying the overall device structure while maintaining comprehensive sampling capability.
Solution Approach 2:
The patent replaces the mechanical turntable system with an electrical switching system that activates different probes in a fixed array. This substitution eliminates mechanical components, reduces structural complexity, and simplifies the device while maintaining omnidirectional sampling capability.
4Ease of operation
If a turntable is used to support the object being tested, then rotation is enabled, but weight capacity is limited by bearing capacity
Solution Approach 1:
The patent replaces the mechanical turntable support system with a fixed probe array system. The probes are mounted on a rigid structure that does not require rotation, eliminating weight capacity limitations associated with mechanical bearings while maintaining the ability to perform omnidirectional sampling through electrical switching of the probe array.
Data Source
AI summary
This application provides a polygonal spherical sampling device, belonging to the technical field of spherical field antenna measurement, and including a probe, a mounting rack and a supporting platform. The supporting platform is mounted on the mounting rack for placing an object to be tested. The number of the probes is more than or equal to six, the probes are mounted on the mounting rack and a plurality of the probes are distributed on at least two vertical planes in a three-dimensional spherical space and are arranged around the supporting platform. The vertical planes are arranged symmetrically about a vertical axis, the probes are uniformly distributed at intervals of A degrees on each vertical plane, the probes on a same horizontal plane are uniformly distributed at intervals of B degrees, both A and B are less than or equal to 90.


