Removable Polyimide Dielectric Layer for Dense IC Packaging

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Solution Overview

Problem

The semiconductor industry faces challenges in creating smaller and more integrated semiconductor packages due to limitations in packaging techniques, particularly in achieving high component density and stability during processing, especially with the need for advanced packaging methods like Package-on-Package (PoP) technology.

Innovation Solution

A method involving the formation of a semiconductor package with a dielectric layer that provides strength, durability, and flexibility, which can be efficiently removed in subsequent steps, including the use of a polyimide dielectric layer with an electron-attracting functional group for stability and a wet etching process for efficient removal, allowing for the formation of a front-side redistribution structure and efficient packaging of integrated circuit dies.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a dielectric layer is formed over an integrated circuit die to provide structural support and adhesion, then the stability and durability during processing are improved, but the complexity of subsequent manufacturing steps increases due to the need for selective removal

Engineering Contradiction:
Improvestability during processingVSAvoidmanufacturing process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The dielectric layer uses a specific chemical composition (polyimide with electron-attracting functional groups) that enables selective removal through chemical etching. This parameter change in material composition allows the layer to provide structural stability during processing while being removable in subsequent steps through chemical reactions, resolving the contradiction between reliability and manufacturing complexity

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The dielectric layer acts as an intermediary element that temporarily provides structural support and adhesion during processing, then is selectively removed to expose underlying structures. This intermediary function allows the layer to serve its protective role without permanently complicating the device structure, as it can be cleanly removed when no longer needed

Inventive Principle:
Principle #24Intermediary (Mediator)

2Quantity of substance

If advanced packaging techniques like Package-on-Package are used to achieve high component density, then the integration density is improved, but the difficulty of maintaining stability during processing increases

Engineering Contradiction:
Improvecomponent densityVSAvoidprocessing stability
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The dielectric layer is formed in advance over the integrated circuit die before packaging operations, providing preliminary structural support and adhesion. This preliminary action stabilizes the die structure before the complex Package-on-Package assembly process, enabling high component density while maintaining processing stability through the protective dielectric layer

Inventive Principle:
Principle #10Preliminary action

3Strength

If a dielectric layer with high strength and durability is used to maintain robust adhesion during processing, then the reliability is improved, but the ease of removal in subsequent steps deteriorates

Engineering Contradiction:
Improveadhesion strengthVSAvoidease of removal
Core Design Contradiction:
StrengthVSEase of manufacture

Solution Approach 1:

The dielectric layer's chemical composition is specifically designed with electron-attracting functional groups that create a dual-character material: strong mechanical adhesion to substrates and devices, but high chemical reactivity to specific etchants. This parameter change enables the layer to be both strong and easily removable, resolving the contradiction between adhesion strength and ease of removal

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The chemical reactivity that would normally make a material difficult to remove is converted into a benefit through selective etching. The electron-attracting functional groups create chemical susceptibility that allows easy removal via wet etching, transforming what could be a harmful property (chemical reactivity) into a useful feature for manufacturing

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the creation of stable and densely integrated semiconductor packages with improved manufacturing efficiency, maintaining robust adhesion and durability during processing, and facilitating efficient etching, thus addressing the need for smaller and more integrated semiconductor devices.

Implementation Method 1

a dielectric layer that provides strength, durability, and flexibility, which can be efficiently removed in subsequent steps, including the use of a polyimide dielectric layer with an electron-attracting functional group for stability

Methodology Applied
Scientific EffectChemical bonding: Chemical Bonding

Implementation Method 2

a wet etching process for efficient removal

Methodology Applied
Scientific EffectWet etching:

Data Source

PatentUS12009226B2Semiconductor device and method of forming same
Publication Date: 2024.06.11 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US12009226B2 patent drawing
  • US12009226B2 patent drawing
  • US12009226B2 patent drawing

AI summary

A method includes attaching an integrated circuit die adjacent to a first substrate, the integrated circuit die comprising: an active device in a second substrate; a pad adjacent to the second substrate; and a first dielectric layer adjacent to the second substrate, the first dielectric layer comprising a polyimide with an ester group; forming an encapsulant around the integrated circuit die; and removing the first dielectric layer.