Polycrystalline Silicon Quenching Prevents Phosphorus Buildup

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Solution Overview

Problem

The existing processes for producing polycrystalline silicon rods suffer from phosphorus component buildup in the reaction vessel due to the infiltration of phosphorus-silicon compounds in the discharge gas, which reduces the purity of the obtained silicon, despite quenching the discharge gas from 1000°C to 800°C in less than 0.2 seconds.

Innovation Solution

Quenching the discharge gas from 800°C to 500°C in no longer than 0.1 second to prevent the formation of phosphorus-silicon compounds that are difficult to separate from silane compounds, allowing for the effective reuse of silane gas by maintaining the reaction vessel at high temperatures and using a cooler with spray nozzles to achieve rapid quenching.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of time

If the discharge gas is quenched from 1000°C to 800°C in not longer than 0.2 seconds, then the residence time in high temperature region is reduced, but phosphorus component still builds up and deposits on polycrystalline silicon rods

Engineering Contradiction:
Improveresidence time in high temperature regionVSAvoidphosphorus component buildup
Core Design Contradiction:
Loss of timeVSObject-affected harmful factors

Solution Approach 1:

The patent changes the quenching parameters by lowering the final temperature from 800°C to 500°C and reducing the quenching time to 0.1 seconds or less. This parameter optimization prevents phosphorus-silicon compound formation more effectively than the prior art's 800°C quenching temperature.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent applies rapid quenching that rushes through the critical temperature region where phosphorus-silicon compounds form. By quenching from 800°C to 500°C in 0.1 seconds or less, the process skips the dangerous temperature window that allows phosphorus infiltration, preventing compound formation.

Inventive Principle:
Principle #21Skipping (Rushing through)

2Ease of operation

If the discharge gas is quenched slowly, then the separation of silane compound is easier, but phosphorus-silicon compounds form and contaminate the silane gas

Engineering Contradiction:
Improveseparation of silane compoundVSAvoidpurity of silane compound
Core Design Contradiction:
Ease of operationVSManufacturing precision

Solution Approach 1:

The patent uses rapid quenching to rush through the temperature region where phosphorus-silicon compounds form, preventing contamination of the silane compound while still allowing easy separation afterward due to the low final temperature.

Inventive Principle:
Principle #21Skipping (Rushing through)

Solution Approach 2:

The patent optimizes the quenching parameters (temperature and time) to achieve a state where phosphorus-silicon compound formation is suppressed but silane compound remains easily separable through conventional methods.

Inventive Principle:
Principle #35Parameter changes

3Stability of the object's composition

If the quenching time is extended, then the temperature uniformity improves, but phosphorus component infiltrates and forms compounds with silane

Engineering Contradiction:
Improvetemperature uniformityVSAvoidpurity of polycrystalline silicon
Core Design Contradiction:
Stability of the object's compositionVSManufacturing precision

Solution Approach 1:

The patent applies ultra-rapid quenching that completes the cooling process in 0.1 seconds or less, rushing through the temperature region where phosphorus infiltration occurs. This prevents phosphorus-silicon compound formation while maintaining sufficient temperature uniformity for process stability.

Inventive Principle:
Principle #21Skipping (Rushing through)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach effectively suppresses the formation of phosphorus-silicon compounds, enabling the easy separation and reuse of silane gas, thereby maintaining the purity of polycrystalline silicon rods and preventing phosphorus buildup in the reaction vessel.

Implementation Method 1

the discharge gas discharged from the reaction vessel is quenched so that the temperature thereof drops from 800°C down to 500°C in not longer than 0.1 second

Methodology Applied
Scientific EffectRapid quenching: Cooling

Implementation Method 2

depositing polycrystalline silicon on silicon core members arranged being erected in a reaction vessel relying on the chemical vapor-phase deposition method

Methodology Applied
Scientific EffectChemical vapor-phase deposition: Chemical Vapour Deposition

Implementation Method 3

heating the silicon core members by feeding the electric current through the electrodes

Methodology Applied
Scientific EffectJoule heating: Joule Heating

Data Source

PatentEP2394955B1Process for producing polycrystalline silicon
Publication Date: 2016.12.07 TOKUYAMA CORP
  • EP2394955B1 patent drawingFigure 1

AI summary

[Problem] To provide a process for producing polycrystalline silicon, which is capable of effectively preventing the formation of phosphorus-silicon compounds in the discharge gas discharged from the reaction vessel, and makes it possible to reuse a silane compound contained in the discharge gas. [Means for Solution] The process for producing polycrystalline silicon by feeding a reaction gas containing a silane gas and a hydrogen gas into a reaction vessel equipped with silicon core members erected on the electrodes, heating the silicon core members by flowing an electric current thereto to a temperature at which silicon deposits, forming polycrystalline silicon rods by allowing the formed silicon to deposit on the silicon core members, and discharging the discharge gas after the reaction from the reaction vessel, wherein the discharge gas discharged from the reaction vessel is quenched so that the temperature thereof drops from 800°C down to 500°C in not longer than 0.1 second.