Polyurea Air-Gap Formation in Semiconductor Recesses

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

The existing techniques for forming air gaps in semiconductor devices face challenges in achieving desired shapes and sizes, particularly in recesses with arbitrary shapes, which affects parasitic capacitance and mechanical strength, and result in inefficient material consumption due to non-selective film formation across varying wiring intervals.

Innovation Solution

A method involving a multi-chamber vacuum processing system that adjusts the substrate temperature between 200°C and 280°C, laminates a polyurea film using isocyanate and amine gases, and thermally decomposes the film to form air gaps under a sealing film, allowing for selective film formation in recesses with narrow widths.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of substance

If a film is formed using existing techniques, then film formation occurs across the entire substrate, but this results in non-selective film formation and inefficient material consumption

Engineering Contradiction:
Improvematerial consumption efficiencyVSAvoidselective film formation capability
Core Design Contradiction:
Loss of substanceVSEase of manufacture

Solution Approach 1:

The patent applies local quality by making the film formation process selective to specific regions (narrow-width recesses) rather than uniform across the entire substrate. The polyurea film is formed only in recesses with width less than a predetermined value, achieving spatially differentiated film deposition that improves material efficiency while maintaining manufacturing feasibility through temperature-controlled selective polymerization

Inventive Principle:
Principle #3Local quality

2Reliability

If air gaps are formed in recesses with arbitrary shapes, then parasitic capacitance is optimized, but the shape and size control of air gaps becomes difficult

Engineering Contradiction:
Improveparasitic capacitance optimizationVSAvoidair gap shape and size control
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent applies parameter changes by controlling the substrate temperature (200-280°C) to regulate the polymerization reaction of isocyanate and amine gases. This temperature control enables precise formation of polyurea films with specific thicknesses and shapes that match the recess geometry, allowing accurate air gap formation in recesses with arbitrary shapes while maintaining manufacturing precision

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent uses a polyurea film as an intermediary material to define the air gap shape and size. The film is formed in the recesses and then removed to create air gaps, allowing indirect control of air gap geometry through the intermediate film formation process, which improves both shape control and parasitic capacitance optimization

Inventive Principle:
Principle #24Intermediary (Mediator)

3Ease of manufacture

If the substrate temperature is not controlled within 200-280°C, then the film formation process is simpler, but selective film formation in narrow-width recesses cannot be achieved

Engineering Contradiction:
Improvefilm formation process simplicityVSAvoidselective film formation in narrow recesses
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The patent applies parameter changes by setting the substrate temperature within the specific range of 200-280°C to enable selective polymerization of isocyanate and amine gases only in narrow-width recesses. This temperature parameter control creates the necessary conditions for selective film formation while maintaining process feasibility through standard semiconductor manufacturing equipment

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the formation of air gaps with predetermined shapes and sizes, optimizing parasitic capacitance and mechanical strength while reducing material waste by selectively forming films in narrow-width recesses.

Implementation Method 1

adjusting a temperature of a substrate having a recess formed therein and accommodated in a container to a temperature within a range of 200 degrees C. or higher and 280 degrees or lower

Methodology Applied
Scientific EffectThermal heating: Heating

Implementation Method 2

laminating a polyurea film in the recess in the substrate by supplying isocyanate gas and amine gas into the container

Methodology Applied
Scientific EffectPolymerization: Photopolymerisation

Implementation Method 3

thermally decomposes the film to form air gaps under a sealing film

Methodology Applied
Scientific EffectThermal decomposition: Pyrolysis

Data Source

PatentUS12191193B2Method of manufacturing semiconductor device and film forming apparatus
Publication Date: 2025.01.07 TOKYO ELECTRON LTD
  • US12191193B2 patent drawing
  • US12191193B2 patent drawing
  • US12191193B2 patent drawing

AI summary

A method of manufacturing a semiconductor includes adjusting a temperature of a substrate having a recess formed therein and accommodated in a container to a temperature within a range of 200 degrees C. or higher and 280 degrees or lower, and laminating a polyurea film in the recess in the substrate by supplying isocyanate gas and amine gas into the container.