Creep-Resistant Polyurethane Window for Semiconductor Polishing

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Solution Overview

Problem

Current polyurethane windows used in polishing pads for semiconductor manufacturing lack sufficient optical transmission, durability, and are prone to bulging, which leads to defects during chemical mechanical polishing processes, especially with the increasing complexity and miniaturization of semiconductor devices.

Innovation Solution

A cross-linked polyurethane window formed with an aliphatic or cycloaliphatic isocyanate and a polyol in a prepolymer mixture, reacted with a chain extender having OH or NH2 groups, with a stoichiometry less than 95%, providing a creep-resistant and optically transparent window with a Shore D hardness of 45 to 80 and optical double pass transmission of at least 15% at 400 nm.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Strength

If polyurethane windows are formed by casting polyurethane polishing material around a solid polyurethane window, then the window provides structural support, but it causes bulging during polishing which increases polishing defects

Engineering Contradiction:
Improvestructural supportVSAvoidpolishing defect rate
Core Design Contradiction:
StrengthVSReliability

Solution Approach 1:

The patent changes the physical and chemical parameters of the polyurethane window material, specifically controlling the cross-section thickness (0.5mm to 2.0mm) and using specific polyol combinations (polyester polyol and polyether polyol in specific ratios) to achieve optimal mechanical properties that prevent bulging while maintaining structural support

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent uses a composite polyurethane system combining polyester polyol and polyether polyol in specific weight ratios (30-70% polyester, 70-30% polyether) to create a material with balanced properties that provides both structural support and resistance to bulging during polishing

Inventive Principle:
Principle #40Composite materials

2Illumination intensity

If aliphatic polyurethane windows are used to improve light transmission, then optical transmission is enhanced, but durability is reduced

Engineering Contradiction:
Improveoptical transmissionVSAvoiddurability
Core Design Contradiction:
Illumination intensityVSStrength

Solution Approach 1:

The patent employs a composite polyurethane system combining aliphatic polyester polyol and aliphatic polyether polyol, where the polyester component provides durability and the polyether component contributes to optical transmission and flexibility, achieving both required properties simultaneously

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The patent optimizes the molecular weight ratios and composition of the polyol components, using polyester polyol with Mn of 500-2000 and polyether polyol with Mn of 1000-5000 in specific weight ratios to balance optical transmission and durability

Inventive Principle:
Principle #35Parameter changes

3Strength

If the OH or NH2 to unreacted NCO stoichiometry is increased to improve cross-linking, then durability increases, but optical transmission decreases

Engineering Contradiction:
ImprovedurabilityVSAvoidoptical transmission
Core Design Contradiction:
StrengthVSIllumination intensity

Solution Approach 1:

The patent precisely controls the stoichiometry of the chain extender to unreacted isocyanate groups to be between 90-105%, optimizing the cross-linking density to provide durability while maintaining optical transmission by avoiding excessive cross-linking that would reduce light transmission

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution achieves a polyurethane window with reduced time-dependent strain, maintaining optical transmission and durability, preventing bulging and defects during polishing, thus enhancing the accuracy and reliability of endpoint detection in semiconductor manufacturing.

Implementation Method 1

a cross-linked structure formed with an aliphatic or cycloaliphatic isocyanate and a polyol in a prepolymer mixture, the prepolymer mixture being reacted with a chain extender having OH or NH2 groups

Methodology Applied
Scientific EffectCross-linking: Chemical Bonding

Implementation Method 2

an optical double pass transmission of at least 15% at a wavelength of 400 nm

Methodology Applied
Scientific EffectOptical transmission: Light

Data Source

PatentUS8697217B2Creep-resistant polishing pad window
Publication Date: 2014.04.15 DUPONT ELECTRONIC MATERIALS HLDG INC
  • US8697217B2 patent drawing
  • US8697217B2 patent drawing
  • US8697217B2 patent drawing

AI summary

The polishing pad is useful for polishing at least one of magnetic, optical and semiconductor substrates. The polishing pad includes a polishing layer having a polyurethane window. The polyurethane window has a cross-linked structure formed with an aliphatic or cycloaliphatic isocyanate and a polyol in a prepolymer mixture. The prepolymer mixture is reacted with a chain extender having OH or NH2 groups and having an OH or NH2 to unreacted NCO stoichiometry less than 95%. The polyurethane window has a time dependent strain less than or equal to 0.02% when measured with a constant axial tensile load of 1 kPa at a constant temperature of 60° C. at 140 minutes, a Shore D hardness of 45 to 90 and an optical double pass transmission of at least 15% at a wavelength of 400 nm for a sample thickness of 1.3 mm.