On-Chip POR Pulse Generation With Low-Noise Reset Timing

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Solution Overview

Problem

Reducing the area and complexity of on-chip circuits that generate power on reset (POR) pulses while minimizing inter-module and inter-chip noise is challenging in integrated circuits like System on Chips (SoCs).

Innovation Solution

The integration of a power supply sense circuit, pulse generation circuit, and reset generation circuit, utilizing voltage dividers, MOS transistors, inverter circuits, delay blocks with Miller amplifiers, and Schmitt trigger buffers to generate a POR pulse of specific duration for resetting circuit elements, such as flip-flops and memory devices.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Object-affected harmful factors

If a power on reset (POR) pulse is generated on-chip, then noise immunity is improved, but circuit area and complexity increase

Engineering Contradiction:
Improvenoise immunityVSAvoidcircuit complexity
Core Design Contradiction:
Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The POR generation circuit is divided into multiple functional blocks: a power supply sensing block that detects voltage transitions, a pulse generation block that creates the POR pulse, and a delay block that controls pulse width. This segmentation allows each block to be optimized independently, reducing overall complexity while maintaining noise immunity benefits of on-chip generation.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The POR generation circuit is designed to work with multiple power supply voltages and different circuit configurations within the SoC. The sensing block can detect transitions on different voltage rails, and the pulse generation logic is configured to produce appropriate POR signals for various memory devices and logic blocks, reducing the need for separate POR circuits for each component.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Ease of manufacture

If circuit area is reduced, then manufacturing cost decreases, but POR pulse generation reliability deteriorates

Engineering Contradiction:
Improvemanufacturing costVSAvoidPOR pulse generation reliability
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The circuit employs dynamic element sizing where transistor widths and capacitor values are optimized based on their specific functional requirements rather than using uniform sizing throughout. Critical components involved in pulse detection and generation use larger dimensions for higher reliability, while less critical routing and control elements use minimal area implementations, achieving an optimal balance between reliability and area.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent introduces intermediate sensing nodes and buffer stages that mediate between the power supply voltage transitions and the final POR pulse output. These intermediary elements amplify and condition the signal, ensuring reliable pulse generation even with minimal area implementation, while also providing noise filtering that enhances signal integrity.

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS8797072B2Pulse generation circuits in integrated circuits
Publication Date: 2014.08.05 TEXAS INSTRUMENTS INC
  • US8797072B2 patent drawing
  • US8797072B2 patent drawing
  • US8797072B2 patent drawing

AI summary

Integrated Circuits (ICs) comprising circuits configured to generate a power on reset (POR) pulse are disclosed. An IC comprises a power supply sense circuit configured to generate a sense signal in response to a transition of a power supply signal from a first level to a second level, and a pulse generation circuit coupled with the power supply sense circuit. The pulse generation circuit is configured to generate a power on reset (POR) pulse of a threshold duration based on the sense signal. The IC further includes a reset generation circuit coupled with the pulse generation circuit to receive the POR pulse. The reset generation circuit is configured to generate a reset pulse based on the POR signal and of at least one control signal, where the reset pulse is configured to be utilized to perform a reset of one or more elements of the integrated circuit.