Porous Silicon Capacitor Structure for High Capacitance Density

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Solution Overview

Problem

Existing capacitors face limitations in increasing electrostatic capacitance, as the substrate's porosity does not effectively enhance surface areas without compromising strength.

Innovation Solution

A capacitor design featuring a silicon substrate with a porous part in the capacitance generation region, where a conductor layer fills the pores and a dielectric layer is applied between the pore surfaces, allowing for increased surface area without reducing substrate strength.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If the substrate is made porous to increase surface area, then electrostatic capacitance is improved, but substrate strength deteriorates

Engineering Contradiction:
Improveelectrostatic capacitanceVSAvoidsubstrate strength
Core Design Contradiction:
Quantity of substanceVSStrength

Solution Approach 1:

The patent applies local quality by creating porous structures only in specific regions where capacitance enhancement is needed, while maintaining dense, strong substrate in other regions. The porous part is selectively formed in the capacitance generation region, allowing surface area expansion without compromising overall substrate strength.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent employs composite materials by combining porous silicon structures with conductor and dielectric layers. The porous silicon provides high surface area for capacitance, while the conductor and dielectric layers form a composite structure that maintains mechanical integrity and electrical functionality.

Inventive Principle:
Principle #40Composite materials

2Ease of manufacture

If conventional trench capacitor methods are used, then manufacturing is simplified, but electrostatic capacitance cannot be sufficiently increased

Engineering Contradiction:
Improvemanufacturing simplicityVSAvoidelectrostatic capacitance
Core Design Contradiction:
Ease of manufactureVSQuantity of substance

Solution Approach 1:

The patent utilizes porous materials by forming a porous part within the silicon substrate through anodization. This porous structure dramatically increases the surface area available for capacitance generation, enabling significantly higher electrostatic capacitance values compared to conventional trench capacitor approaches.

Inventive Principle:
Principle #31Porous materials

Solution Approach 2:

The patent transitions from two-dimensional surface capacitors to three-dimensional porous structures. By creating porous regions that extend into the substrate thickness direction, the effective surface area for capacitance is multiplied without increasing the device footprint, thereby achieving higher capacitance density.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design significantly enhances electrostatic capacitance by increasing the surface area of electrodes while maintaining the strength of the silicon substrate.

Implementation Method 1

the silicon substrate has a porous part provided in a thickness direction in the capacitance generation region

Methodology Applied
Scientific EffectPorosity: Porosity

Implementation Method 2

forming, by an anode oxidation process, a porous part in the capacitance generation region

Methodology Applied
Scientific EffectAnode oxidation: Oxidation

Data Source

PatentUS11784000B2Capacitor and method for producing same
Publication Date: 2023.10.10 PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO LTD
  • US11784000B2 patent drawing
  • US11784000B2 patent drawing
  • US11784000B2 patent drawing

AI summary

A capacitor includes a silicon substrate, a conductor layer, and a dielectric layer. The silicon substrate has a principal surface including a capacitance generation region and a non-capacitance generation region. The silicon substrate has a porous part provided in a thickness direction in the capacitance generation region. The conductor layer has a surface layer part at least covering part of a surface of the capacitance generation region and a filling part filled in at least part of fine pores of the porous part. The dielectric layer is provided between an inner surface of the fine pores and the filling part.