Portable Digital Test System for Radiation Environments
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Solution Overview
Problem
Current digital test systems for electronics are large, expensive, heavy, and not portable, making them unsuitable for radiation testing, as they are not designed to withstand radiation exposure and lack the necessary portability and interface capabilities for varied environments and conditions.
Innovation Solution
A digital test system that includes a device under test (DUT) coupled with sensors to monitor and record environmental factors, featuring a field-programmable gate array (FPGA) for control, user-programmable interfaces, and a compact design to minimize radiation exposure, allowing for portable and efficient radiation testing in various environments.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional digital test systems are used, then testing capability is provided, but the systems are large, heavy, and not portable
Solution Approach 1:
The test system is divided into separate functional modules including a radiation-hardened computing device, sensors, and interface components that can be independently configured and transported. This segmentation allows the system to maintain full testing capability while being assembled in smaller, portable units rather than a single large system.
Solution Approach 2:
A radiation-hardened computing device serves as an intermediary between the radiation source and the test equipment, enabling control and data processing while protecting sensitive components from radiation damage. This mediator allows the system to function in radiation environments without requiring the entire system to be radiation-hardened.
2Reliability
If radiation exposure is minimized for test system components, then component reliability is maintained, but testing flexibility in radiation environments is reduced
Solution Approach 1:
Different components of the test system have different radiation hardening levels matched to their specific radiation exposure requirements. The radiation-hardened computing device and critical components are protected, while non-critical components can operate in higher radiation environments, providing both reliability and testing flexibility.
Solution Approach 2:
The radiation-hardened computing device acts as a protective intermediary that can operate in radiation environments while shielding more sensitive components. This allows the system to test devices in radiation environments without exposing all components to harmful radiation levels.
3Reliability
If test system components are protected from radiation, then system reliability is maintained, but interface capabilities and portability are limited
Solution Approach 1:
The radiation-hardened computing device serves as an intermediary that maintains reliable communication and control interfaces while protecting sensitive components from radiation. This mediator enables robust interface capabilities including wireless communication without compromising system reliability in radiation environments.
Data Source
AI summary
A highly flexible, compact, lightweight, and portable testing system for use with radiation testing activities. The testing system is coupled to a device under test (DUT), which can be positioned in such a way that the top of the die package is exposed to the direct ion beam during radiation testing. A variety of sensors, onboard memory systems, programmable interfaces, onboard control systems, data output devices, and different types of interfaces are also provided which provide an ability to perform testing procedures while having a maximum ability to orient the DUT and perform a wide variety of testing currently unavailable.