Portable Storage Device Hardware Defect Detection
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Solution Overview
Problem
Semiconductor manufacturers face challenges in efficiently and cost-effectively performing in-field tests to identify and return defective computer processors due to structural or aging defects, as existing solutions like big-iron testers are cumbersome and expensive, while remote debugging and portable solutions like CCD are inefficient for structural defects and incur significant delays.
Innovation Solution
A portable storage device, such as a USB stick, is used to perform structural and logical tests on computing systems, with encrypted test patterns and results, allowing secure and efficient detection of hardware defects at the location of deployment, distinguishing between structural/aging and logical defects, and securely executing tests only on authorized systems.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If big-iron testers are used for in-field manufacturing tests, then manufacturing test accuracy and reliability are improved, but device complexity, cost, and portability are worsened
Solution Approach 1:
The patent extracts the essential testing functionality from the complex big-iron tester by implementing a portable storage device that contains only the necessary test patterns and instructions. This allows the computing system to perform manufacturing tests using its own built-in resources rather than requiring external specialized equipment, thereby reducing device complexity while maintaining test reliability.
Solution Approach 2:
The patent creates a portable copy of the testing system in the form of a storage device containing test patterns. Instead of transporting the entire big-iron tester, the essential test data is copied to a portable medium that can be read by the computing system's processor, achieving simplified testing without sacrificing accuracy.
2Reliability
If big-iron testers are transported to field locations for testing, then manufacturing test capability is improved, but loss of time and operational efficiency are worsened
Solution Approach 1:
The patent performs preliminary action by pre-storing test patterns and instructions in the portable storage device before the computing system needs to be tested. This eliminates the need to transport and setup big-iron testers at field locations, as all necessary test data is already available on the portable device, significantly reducing testing time delays.
3Reliability
If all returned products are shipped back to manufacturer for testing, then manufacturing quality control is improved, but loss of energy and operational cost are worsened
Solution Approach 1:
The patent enables the computing system to perform self-testing using its own processor and the portable storage device. The system can independently execute test patterns, analyze results, and determine whether defects are structural or logical without requiring manufacturer intervention. This self-service capability allows quality control to be performed at the point of deployment, eliminating unnecessary transport costs for products that don't require manufacturer attention.
Data Source
AI summary
Methods, apparatus, and computer programs are disclosed to detect computing system hardware defects using a portable storage device. In one embodiment, a method includes accessing a portable storage device to obtain an identifier and a set of test patterns to test a set of circuits of a computing system, the identifier to map to the set of test patterns. The method further includes determining that the set of test patterns is to be executed on the computing system based on the identifier to be obtained from accessing the portable storage device. Responsive to the determination, and executing the set of test patterns loaded from the portable storage device on the set of circuits of the computing system to detect one or more hardware defects of the set of circuits.