Portable Surface Topography Measurement Device
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Solution Overview
Problem
Existing methods for evaluating surface quality, particularly on motor-vehicle bodywork, face challenges with weakly reflective base coats and the need for a portable, simple-to-operate system that can assess surface unevenness and visual impression effectively.
Innovation Solution
A portable device with a measurement apparatus that directly determines local topography and a processor to calculate global topography, using a light source with multiple wavelengths and a spectrometer or CCD chips to analyze reflected light, allowing for direct evaluation of surface quality and base coat quality.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Illumination intensity
If infrared light is used to enable evaluation of base coats, then sufficient light reflection is achieved, but the evaluation remains indirect and complex
Solution Approach 1:
The patent replaces indirect optical evaluation methods with direct mechanical measurement using a portable profilometer that physically scans the surface to determine topography, eliminating the need for complex optical evaluation of weakly reflective surfaces
Solution Approach 2:
The patent introduces a chromatic lens apparatus as an intermediary that disperses white light into its spectral components, allowing the spectrometer to analyze surface topography through wavelength-dependent light scattering rather than relying on weak reflected light
2Measurement precision
If mechanical roughness measuring devices are used, then surface roughness can be measured, but the devices are stationary and cumbersome
Solution Approach 1:
The patent replaces stationary mechanical roughness measuring devices with a portable measurement apparatus that combines optical measurement (spectrometer) with minimal mechanical contact, enabling mobile surface analysis while maintaining measurement precision
Solution Approach 2:
The patent creates a multi-functional portable device that can measure both local topography through the profilometer and spectral characteristics through the spectrometer, making it suitable for diverse surface analysis applications including base coats and painted surfaces
3Measurement precision
If layer-thickness measurement devices are used, then integral layer thickness can be determined, but local topography cannot be characterized
Solution Approach 1:
The patent segments the surface measurement into multiple local points through the profilometer's ability to measure topography at individual locations, then combines this local data with spectral information from the spectrometer to achieve both local topography characterization and overall surface evaluation
Solution Approach 2:
The patent adds the spectral dimension to traditional topography measurement by using the spectrometer to analyze wavelength-dependent light scattering, enabling characterization of surface topography through optical properties rather than just geometric measurement
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate and efficient characterization of surface topography and visual impression, even on weakly reflective surfaces, providing statistical values and Fourier coefficients for comprehensive analysis.
Implementation Method 1
a light source (12), which radiates light with a multiplicity of different wavelengths onto the surface to be examined
Implementation Method 2
the light radiated onto the surface is reflected and directed in the direction of the spectrometer. Depending on the topography or the height of the coating, different colour components of the light will herein preferentially reach the spectrometer
Implementation Method 3
a chromatic lens apparatus is disposed between the light source and the surface. By means of this chromatic lens apparatus, the components of the white light are dispersed along its optical axis
Data Source
AI summary
The invention relates to a portable device (1) for the determination of surface properties with a measurement apparatus (10) which directly determines locally the topography of a surface (8) under investigation and issues at least one measured value that is characteristic of this local topography, and with a processor apparatus which, taking account of a multiplicity of initial measured values, issues at least one result value characteristic of the global topography of the surface.