Position-Controlled ESD Test Device for Safer Semiconductor Testing
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Solution Overview
Problem
Conventional ESD testing of semiconductor devices is inefficient and potentially dangerous due to manual handling and the need for human involvement in discharging electrical charges, which can lead to time-consuming and hazardous situations.
Innovation Solution
A test device comprising an electrostatic discharge test circuit, a frame, and processing circuitry that automates the movement of the device to simulate electrostatic discharge events, allowing for the discharge of static electricity through the semiconductor device without human intervention.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If manual handling and human involvement are used in ESD testing, then the testing can be performed, but the process becomes time-consuming and hazardous
Solution Approach 1:
The test device performs ESD testing autonomously without requiring human involvement. The device automatically charges capacitors through a power supply circuit and discharges them through the semiconductor device under test, enabling the system to service itself and eliminating both safety risks and time losses associated with manual handling
Solution Approach 2:
The patent replaces manual mechanical operations with an automated electrical system. Instead of manually discharging static electricity from the human body, the system uses a power supply circuit to charge capacitors and an automated discharge path to simulate ESD events, substituting mechanical human action with controlled electrical processes
2Reliability
If manual ESD testing is performed, then electrostatic discharge susceptibility can be tested, but human safety is at risk
Solution Approach 1:
The patent introduces intermediary components between the power source and the semiconductor device under test. Capacitors serve as energy storage intermediaries that are charged by the power supply circuit and then discharged through the test device, while a control circuit acts as an intermediary to manage the discharge timing and path, thereby isolating operators from direct exposure to high voltage and electrostatic discharge risks
Solution Approach 2:
The system replaces manual electrostatic discharge procedures with an automated electrical simulation system. The power supply circuit and capacitor assembly create controlled electrostatic conditions without requiring human bodies to generate or discharge static charge, eliminating safety hazards while maintaining testing accuracy
3Productivity
If automated testing is implemented, then testing efficiency improves, but device complexity increases
Solution Approach 1:
The test device is designed as a multi-functional integrated system where a single unit can perform multiple operations: the power supply circuit charges capacitors for ESD testing, the same device can discharge controlled electrical energy, and the system includes measurement capabilities to assess semiconductor device susceptibility. This multi-functionality consolidates what would otherwise require separate pieces of equipment into one automated testing platform
Solution Approach 2:
The patent combines multiple functional components into a unified test device structure. The power supply circuit, capacitor assembly, control circuitry, and measurement systems are merged into a single integrated device that automates the entire ESD testing process, reducing the need for multiple separate instruments while maintaining comprehensive testing capability
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enables efficient and safe testing of semiconductor devices for electrostatic discharge susceptibility by automating the discharge process, reducing human risk and improving testing efficiency.
Implementation Method 1
the power supply device being configured to transfer electrical charge to the at least one subject and the electrostatic discharge test circuit
Implementation Method 2
a test device for testing the susceptibility of a test subject to electrostatic discharge (ESD)
Data Source
AI summary
A test device includes an electrostatic discharge test circuit electrically connected to at least one subject, a frame configured to accommodate the at least one subject and the electrostatic discharge test circuit, a transport device configured to move, the movement of the transport device causing the frame to move, and processing circuitry configured to, control the movement of the transport device such that the electrostatic discharge test circuit becomes electrically connected to a power supply device based on a position of the transport device, and control the movement of the transport device such that the at least one subject becomes electrically connected to a host device based on the position of the transport device.