Position-Specific Illumination for Surface Measurement Accuracy
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Solution Overview
Problem
In factory automation, existing image processing technologies face challenges in achieving accurate image measurement across different surface regions of a target due to varying illumination conditions, leading to inconsistent measurement accuracy.
Innovation Solution
An image processing system that varies the light emission states of multiple light emitting units and generates image data based on specific conditions associated with each surface region, allowing for optimal illumination and data generation tailored to the position, thereby improving measurement accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single illumination condition is used for all image data, then the system complexity is reduced, but the measurement precision varies across different surface regions
Solution Approach 1:
The patent applies local quality by determining illumination conditions and generation conditions separately for each position or region of the image data. The determination unit sets position-specific parameters such as illumination intensity, wavelength, and polarization state according to the local surface characteristics, ensuring optimal measurement precision for each region while managing complexity through automated determination
Solution Approach 2:
The patent implements dynamics by making the illumination condition and generation condition variable rather than fixed. The system dynamically adjusts illumination parameters and image generation conditions based on the specific position being measured, allowing the measurement system to adapt to different surface regions and their unique measurement requirements
2Measurement precision
If multiple illumination conditions are used for different surface regions, then the measurement precision is improved, but the device complexity increases
Solution Approach 1:
The patent employs feedback mechanisms where the determination unit automatically determines optimal illumination and generation conditions based on position information and measurement requirements. The system uses feedback from position detection and surface characteristics to automatically adjust illumination parameters, reducing the need for manual configuration and complex control while maintaining high measurement precision
Solution Approach 2:
The patent achieves universality by creating a determination unit that can handle multiple types of measurements across different surface regions using a single integrated system. The determination unit universally applies the principle of position-specific condition determination to various measurement tasks, eliminating the need for multiple specialized illumination systems for different measurement scenarios
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables high measurement accuracy for each surface region by determining the optimal illumination and generation conditions, reducing noise and enhancing feature extraction, especially for tasks like scratch inspection.
Implementation Method 1
an illumination unit in which a plurality of light emitting units for irradiating the target with illumination light are disposed
Data Source
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AI summary
The embodiments of the disclosure set a condition when image data is generated, in association with a position of image data. An image processing device makes a plurality of light emission states of a plurality of light emitting units different according to an illumination condition, and acquires a plurality of pieces of image data obtained by imaging in the plurality of different light emission states. The image processing device generates image data to be used for image measurement from a plurality of pieces of acquired image data on the basis of a generation condition defined in association with a position in the image data. In the image processing device, at least one of the illumination condition and the generation condition is determined so that the generated image data becomes image data suitable for a purpose of the image measurement.