Positioning Frequency Layer Measurement for Wireless Nodes

The patent segments the positioning frequency layer measurement process into distinct phases: capability reporting phase where the UE indicates its measurement capabilities, assistance data provision phase where the network provides configuration information, and selective measurement phase where measurements are performed based on received assistance data. This segmentation allows the system to achieve accurate positioning while managing device complexity through structured, phased processing.

The patent implements preliminary action by requiring the UE to report its positioning capabilities and receive assistance data before actual positioning measurements are performed. The network pre-configures the UE with necessary measurement parameters, frequency layer information, and resource allocations in advance, enabling efficient and accurate measurements without overwhelming the device during the actual positioning process.

The patent implements dynamic measurement strategies where the UE adaptively selects which frequency layers to measure based on received assistance data and current positioning requirements. The system dynamically adjusts the number and type of frequency layers measured, allowing the UE to optimize between accuracy and latency by performing measurements on prioritized frequency layers first, then optionally adding more layers if time permits and accuracy requirements demand.

The patent changes key parameters including the number of frequency layers measured, the measurement bandwidth, and the measurement timing based on assistance data received from the network. The assistance data contains configuration information that allows the UE to adjust measurement parameters to achieve required positioning accuracy within acceptable time constraints, effectively managing the accuracy-latency tradeoff through parameter optimization.