Post-Silicon Test Data Indexing for Hardware Verification
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
In post-silicon hardware testing, the time window for testing is constrained, and generating complex test data is time-consuming, leading to poor utilization of the testing time and potential for non-representative results, especially when dealing with devices having limited memory and requiring thorough verification of complex functionalities.
Innovation Solution
A method involving the offline generation of a large collection of test data for various domains, followed by selection and indexing of relevant subsets to fit within the device's memory, allowing for efficient online testing and high utilization of the testing time window, using an exerciser to execute test cases with pre-generated high-quality test data.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If complex test data is generated during the testing phase, then the thoroughness of hardware verification is improved, but the testing time increases significantly
Solution Approach 1:
The patent applies preliminary action by generating and storing complex test data in advance before the actual testing phase. A database is pre-populated with extensively validated test cases, allowing the testing system to simply retrieve and execute pre-generated test data rather than generating it during the time-constrained testing window, thus resolving the contradiction between verification thoroughness and testing time
Solution Approach 2:
The patent segments the test data generation process from the testing execution process. The complex work of generating and validating test data is separated into a preliminary phase where it is stored in a database, and an execution phase where pre-generated data is retrieved and used, allowing thorough verification without time loss during actual testing
2Manufacturing precision
If a large amount of test data is generated to cover all chip functionalities, then the coverage of testing is improved, but the device idle time increases while waiting for test generation
Solution Approach 1:
The patent uses preliminary action by pre-generating and storing extensive test data in a database before the testing phase. This eliminates the need for the tested device to wait during the testing window, as all test data is ready in advance, thus improving both coverage and device utilization simultaneously
Solution Approach 2:
The patent introduces an intermediary database that stores pre-generated test data. This database acts as a mediator between the test data generation process and the testing execution, allowing the tested device to continuously execute tests without idle time while still achieving comprehensive coverage through the pre-prepared extensive test data
3Manufacturing precision
If the exerciser generates complex test data during testing, then the quality of test cases is improved, but the complexity of the exerciser increases
Solution Approach 1:
The patent extracts the complex test data generation functionality from the exerciser and places it in a separate database. The exerciser is left with the simple role of retrieving and executing pre-generated test cases, while the complex generation logic resides externally in the database, thus maintaining high test case quality without increasing exerciser complexity
Solution Approach 2:
The patent uses copying by storing pre-generated test cases in a database that the exerciser retrieves. Instead of the exerciser generating complex test data each time, it copies ready-made high-quality test cases from the database, maintaining test quality while keeping the exerciser simple
Data Source
AI summary
An apparatus and a computer-implemented method performed by a computerized device, comprising: generating a collection of test data for testing one or more domains, wherein the test data is useful for post-silicon verification of hardware devices; selecting a subset of the collection of test data in accordance with a hardware device to be tested and at least one of the domains to be tested with respect to the hardware device; and indexing the subset of the collection of test data to obtain an indexed collection.