Power Supply Controller with MTP-to-OTP Parameter Validation

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing power supply devices require engineering change orders (ECOs) to modify control parameters in one-time programmable (OTP) memory circuits when they do not meet expected functions, lacking the ability to adjust and test multiple control parameters efficiently.

Innovation Solution

A controller for a power supply device that includes a determining circuit and a control circuit, allowing multiple programming operations on a multiple-times programmable (MTP) memory circuit, enabling the controller to receive and test different control parameters, and write them into a one-time programmable (OTP) memory circuit only when they meet the expected function.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If control parameters are written into OTP memory circuit, then the power supply device can operate with fixed control parameters, but the device cannot be adjusted or tested with different control parameters without engineering change orders

Engineering Contradiction:
Improveability to test different control parametersVSAvoidmodification process complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The memory system is divided into two distinct parts: an MTP memory circuit (first memory circuit) that allows multiple programming operations for testing different control parameters, and an OTP memory circuit (second memory circuit) that stores the final validated control parameters. This segmentation enables the testing and validation process without requiring modifications to the permanent storage structure, thus improving adaptability while maintaining system stability.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The MTP memory circuit serves as an intermediary between the external parameter input and the OTP memory circuit. It allows multiple control parameters to be temporarily stored and tested during the validation process, acting as a buffer that enables iterative testing without committing changes to the permanent OTP storage until validation is complete.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Productivity

If control parameters are written into OTP memory circuit, then the power supply device has stable operation, but any parameter modification requires engineering change orders which increases time and cost

Engineering Contradiction:
Improvetesting efficiencyVSAvoidtime for parameter validation
Core Design Contradiction:
ProductivityVSLoss of time

Solution Approach 1:

The system performs preliminary testing and validation of control parameters in the MTP memory circuit before finalizing them in the OTP memory circuit. This preliminary action allows multiple parameters to be tested and validated during the manufacturing process, ensuring that only proven parameters are permanently stored, thereby improving testing efficiency and reducing subsequent validation time.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The controller is designed to automatically test and validate control parameters written into the MTP memory circuit during the manufacturing process. This self-service capability allows the device to perform its own parameter validation without requiring external engineering intervention or change orders, thus improving productivity and reducing time loss.

Inventive Principle:
Principle #25Self-service

3Reliability

If OTP memory circuit is used for storing control parameters, then the memory is simple and cost-effective, but it lacks the ability to perform multiple programming operations for testing

Engineering Contradiction:
Improvecontrol parameter validation reliabilityVSAvoidmemory circuit structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The memory system is divided into two distinct parts: an MTP memory circuit (first memory circuit) that allows multiple programming operations for testing different control parameters, and an OTP memory circuit (second memory circuit) that stores the final validated control parameters. This segmentation enables the testing and validation process without requiring modifications to the permanent storage structure, thus improving adaptability while maintaining system stability.

Inventive Principle:
Principle #1Segmentation

4Ease of operation

If multiple-times programmable memory is used for testing control parameters, then the controller can receive and test multiple control parameters, but the structure becomes more complex

Engineering Contradiction:
Improveparameter programming convenienceVSAvoidmemory circuit structure
Core Design Contradiction:
Ease of operationVSDevice complexity

Solution Approach 1:

The MTP memory circuit serves as an intermediary between the external parameter input and the OTP memory circuit. It allows multiple control parameters to be temporarily stored and tested during the validation process, acting as a buffer that enables iterative testing without committing changes to the permanent OTP storage until validation is complete.

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS12431784B2Controller for power supply device
Publication Date: 2025.09.30 POWER FOREST TECH
  • US12431784B2 patent drawing
  • US12431784B2 patent drawing

AI summary

A controller for a power supply device includes a transmission terminal, first and second memory circuits, a determining circuit, and a control circuit. The determining circuit generates a first mode signal when an input voltage value is lower than a reference voltage value and generates a second mode signal when the input voltage value is greater than or equal to the reference voltage value. The control circuit enters a first mode and a second mode in response to the first mode signal and the second mode signal, respectively. The control circuit writes a control parameter from the transmission terminal into the first memory circuit in the first mode and uses the control parameter in the second mode to test the power supply device. When the control parameter meets an expected function of the power supply device, the control circuit writes the control parameter into the second memory circuit.