Power Converter Fault Isolation for Partial-Load Operation

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Solution Overview

Problem

Electronic modules with semiconductor elements, such as converters or inverters, fail to operate if one semiconductor element is defective, leading to significant downtime costs due to the inability to continue functioning without all components.

Innovation Solution

A method where at least two remaining semiconductor elements are controlled to pass a current through the defective element, dividing it and allowing the module to operate in partial load by targeting and destroying or separating the defective element, using pulse width modulation and specific voltage conditions to ensure the defective element is completely destroyed or separated.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the module operates with all semiconductor elements required for full functionality, then full power operation is achieved, but the module fails completely if one element is defective

Engineering Contradiction:
Improveoperational continuityVSAvoidpower output
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent segments the semiconductor elements into two functional groups: essential elements required for basic operation and non-essential elements that enable full power operation. By identifying and isolating the defective element from the essential group, the module can continue operating in a degraded mode, thereby resolving the contradiction between operational continuity and full power output.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent implements partial action by allowing the module to operate with reduced functionality when a semiconductor element is defective. Instead of requiring all elements for operation, the system accepts partial load operation, maintaining essential functions while sacrificing non-essential ones, thus achieving operational continuity at reduced power output.

Inventive Principle:
Principle #16Partial or excessive action

2Reliability

If the defective semiconductor element is immediately destroyed or separated, then full operational reliability is restored, but the module experiences complete downtime

Engineering Contradiction:
Improvefunctional integrityVSAvoiddowntime
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent applies preliminary action by continuously monitoring the operational status of semiconductor elements and identifying defective ones in real-time. This early detection allows the system to switch to degraded mode immediately upon detecting a defect, avoiding complete shutdown and minimizing downtime while maintaining functional integrity through continuous operation in partial load mode.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system prepares for potential defects by designing the circuit topology to allow operation with certain elements disabled. This beforehand cushioning through redundant pathway design enables the module to absorb the failure of individual semiconductor elements without complete shutdown, thus reducing downtime while restoring functional integrity by isolating defective elements.

Inventive Principle:
Principle #11Beforehand cushioning (Prior cushioning)

3Reliability

If high current is passed through the defective semiconductor element to destroy or separate it, then the defective element is completely destroyed or separated, but the remaining semiconductor elements may be damaged

Engineering Contradiction:
Improveelement isolationVSAvoidcomponent integrity
Core Design Contradiction:
ReliabilityVSStrength

Solution Approach 1:

The patent introduces an intermediary control mechanism that manages the destruction or separation process of defective semiconductor elements. This intermediary control system carefully regulates the current applied to defective elements, coordinating the destruction process to isolate faulty components while protecting healthy ones through controlled current distribution and timing, thus achieving element isolation without compromising component integrity.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent applies local quality by directing high current specifically to the defective semiconductor element through targeted control of switching elements, while maintaining normal operating conditions for remaining healthy elements. This localized application of destructive current ensures that only the defective element is destroyed or separated, preserving the integrity of other components through spatially selective current routing.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables the electronic module to continue operating in partial load mode, reducing downtime costs by maintaining functionality despite a defective semiconductor element, although not at full power, by strategically controlling the remaining elements to isolate and destroy the defective one.

Implementation Method 1

a current is passed over the defective semiconductor element by means of a targeted control of at least two of the remaining semiconductor elements in order to destroy or separate the defective semiconductor element

Methodology Applied
Scientific EffectElectrical conduction: Conduction (electrical)

Implementation Method 2

wherein this current is divided among the selectively controlled semiconductor elements

Methodology Applied
Scientific EffectElectrical resistance: Electrical Resistance

Data Source

PatentEP4147337B1Fault tolerant operation of a power converter
Publication Date: 2023.09.06 SIEMENS AG
  • EP4147337B1 patent drawingFigure 1~2

AI summary

The invention relates to a method for operating an electronic module (1) comprising at least three semiconductor elements (S1 to S6), in which, in the event of a defect of one of the semiconductor elements (S1 to S6), by means of targeted control of at least two of the other semiconductor elements (S1 to S6) a current is conducted via the defective semiconductor element (S1 to S6) in order to destroy or disconnect the defective semiconductor element (S1 to S6) or a weak point associated therewith, and this current is distributed to the semiconductor elements (S1 to S6) which are controlled in a targeted manner.