High-Frequency Power Detector Circuit With Replica Envelope Reference
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Solution Overview
Problem
Conventional high frequency power detector circuits in radio communication devices suffer from detection errors due to variations in manufacture, temperature, and supply voltage, leading to impaired communication quality, and require additional circuit components like current sources and reference voltage generating circuits, increasing size and complexity.
Innovation Solution
A high frequency power detector circuit design that utilizes two envelope detector circuits with resistance rows and capacitative elements, a level shifter, and a detector to shift and compare intermediate terminal voltages, eliminating the need for current sources and reference voltage generating circuits, thereby reducing variations and improving precision.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional envelope detector circuits with current sources and reference voltage generating circuits are used, then power detection function is achieved, but detection precision deteriorates due to variations in manufacture, temperature, and supply voltage
Solution Approach 1:
The patent creates a replica of the envelope detector circuit (second envelope detector circuit) to generate a reference signal that automatically tracks variations. By copying the circuit structure and components, the reference signal inherently compensates for manufacturing variations, temperature drift, and supply voltage changes, thereby improving detection precision without requiring external reference voltage generating circuits.
Solution Approach 2:
The envelope detector circuit generates its own reference signal through the replica circuit, eliminating the need for external reference voltage generating circuits and current sources. The circuit uses its internal components (transistors, capacitors, resistors) to self-generate the reference signal, reducing dependency on external components that introduce variations.
2Measurement precision
If current sources and reference voltage generating circuits are added to improve detection accuracy, then measurement precision improves, but device complexity increases
Solution Approach 1:
The patent merges the reference signal generation function into the envelope detector circuit itself by using a replica circuit structure. Instead of adding separate reference voltage generating circuits and current sources, the second envelope detector circuit serves dual purposes: it functions as part of the detection system and simultaneously generates the reference signal, thereby reducing overall circuit complexity.
Solution Approach 2:
The second envelope detector circuit performs multiple functions: it acts as a reference signal generator and simultaneously maintains the same structural characteristics as the first envelope detector circuit. This multi-functional design eliminates the need for dedicated reference voltage generating circuits and current sources, simplifying the overall device.
3Measurement precision
If current sources and reference voltage generating circuits are included, then power detection function is complete, but area of the circuit increases
Solution Approach 1:
The patent combines the reference signal generation functionality within the envelope detector circuit structure itself. The second envelope detector circuit, being a replica of the first, generates the reference signal using the same components (transistors, capacitors, resistors) already present in the detection path, eliminating the need for separate reference voltage generating circuits and current sources, thereby reducing the overall circuit area.
4Productivity
If semiconductor design rules are shrunk to reduce size and cost, then integration is improved, but manufacturing variations increase causing detection errors
Solution Approach 1:
By creating a replica of the envelope detector circuit, the patent ensures that both the detection path and reference signal generation path experience identical manufacturing variations. This copying approach allows the reference signal to automatically track and compensate for variations introduced by scaled semiconductor design rules, maintaining detection precision despite process variations.
Solution Approach 2:
The patent uses the ratio relationship between identical circuit components (transistors, capacitors, resistors) in the first and second envelope detector circuits to cancel out absolute parameter variations. By relying on relative parameter ratios rather than absolute values, the circuit becomes insensitive to manufacturing variations that occur when scaling down design rules.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The proposed design enhances precision and reduces circuit size by minimizing variations in detected power levels, improving communication quality and simplifying the circuit layout.
Implementation Method 1
a capacitative element (120, 220) connected to the resistance row (110, 210) in parallel
Data Source
AI summary
First and second envelope detector circuits have, respectively, a resistance row, a capacitative element connected to the resistance row in parallel and a transistor connected between a connection point between the resistance row and the capacitative element and a predetermined voltage node. An output of a level shifter is supplied to a gate or a base of the transistor of the first envelope detector circuit. A predetermined voltage is supplied to a gate or a base of the transistor of the second envelope detector circuit. A detector detects an intermediate terminal voltage of the resistance row of the first envelope detector circuit with reference to a total voltage or an intermediate terminal voltage of the resistance row of the second envelope detector circuit.