Power Device Analyzer for High-Power I-V Characterization
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Solution Overview
Problem
Current device analyzers lack the power capacity and precision to test high-power devices at or above their safe operating areas without damaging the devices, particularly when measuring high-voltage and high-current characteristics, and struggle with new device technologies that exhibit phenomena like current collapse.
Innovation Solution
A device analyzer system with modular curve trace modules that include high-current and high-voltage capabilities, allowing for narrow pulse voltage modes, constant current source modes, and variable pulse widths, along with a pulse waveform analyzer and signal clip functions to protect devices during testing, enabling precise I-V characteristic measurements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Power
If device analyzers use conventional power sources and measurement methods, then they can test standard electronic devices, but they lack the power capacity and precision to test high-power devices at or above their safe operating areas
Solution Approach 1:
The device analyzer is divided into separate functional modules: a power source module configured to source high voltage and high current, and a measurement module configured to measure voltage and current with high precision. This segmentation allows each module to be optimized independently - the power source can be designed for high power output while the measurement module focuses on precision measurements, resolving the contradiction between power capacity and measurement precision.
2Power
If device analyzers apply test signals at high voltage and high current levels, then they can characterize high-power devices, but they risk damaging the devices under test
Solution Approach 1:
The device analyzer applies test signals in the form of pulses rather than continuous signals. The power source module is configured to output pulsed voltage and current at high power levels, allowing the device to be stressed to its limits during the pulse duration while having recovery time between pulses. This periodic action enables high-power testing without permanently damaging the device, resolving the contradiction between test signal power and device safety.
3Ease of operation
If device analyzers use fixed pulse width testing, then the testing process is simple, but they cannot adequately protect devices from self-heating or adapt to different device requirements
Solution Approach 1:
The device analyzer incorporates variable pulse width capability where the pulse duration can be dynamically adjusted based on the specific device being tested and the test requirements. The power source module and measurement module can adapt their operation to different pulse widths, allowing optimization of the test conditions for each device while maintaining ease of operation through automated control. This dynamic adaptability resolves the contradiction between testing simplicity and device protection capability.
Data Source
AI summary
A device analyzer for analyzing power devices. An example device analyzer comprises a collector supply to generate supply signal pulses with selected voltage or current levels and a supply signal pulse width at a high current. The supply signal pulses are applied at a collector supply source terminal when DUT is connected to conduct current between the collector supply source terminal and a collector supply common terminal. A supply switch closes or opens the DUT current path in narrow pulses having a narrow pulse width narrower than the supply signal pulses to conduct the supply signal pulses as narrowed sweep signal pulses having the high current capacity of the collector supply current. The supply switch alternatively regulates the current in the current path at constant current levels. Other modules capable of high power test capabilities may also be added.