Power Device Life Prediction via Thermal Data Mapping
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional X-ray high voltage apparatuses in medical imaging devices face failures due to damage from temperature amplitude-induced strain, making it difficult to predict the life of power devices and leading to unnecessary radiation exposure and re-performance of radiography operations.
Innovation Solution
Incorporating a temperature sensor and a prediction time period calculation unit that converts temperature data into a table of measured temperatures to estimate the heat cycle life and power cycle life of power devices, allowing for proactive maintenance and avoiding sudden failures.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If temperature amplitude monitoring is implemented to predict power device life, then reliability is improved, but device complexity increases
Solution Approach 1:
The power device itself serves as the temperature sensor by utilizing its internal temperature sensor to detect its own temperature. This self-monitoring approach eliminates the need for separate external temperature sensing systems, thereby improving reliability through continuous self-diagnosis while avoiding additional device complexity from external monitoring components.
Solution Approach 2:
The patent replaces complex mechanical temperature measurement systems with electronic temperature sensing integrated within the power device. By using the internal temperature sensor and processing temperature data through calculation units, the system substitutes physical mechanical monitoring with electronic detection and computation, simplifying the overall system while enhancing prediction accuracy.
2Reliability
If proactive maintenance is performed based on predicted power device life, then reliability is improved, but loss of time occurs due to maintenance interruptions
Solution Approach 1:
The system performs preliminary maintenance actions by predicting power device life based on accumulated temperature data before actual failures occur. The prediction time period calculation unit forecasts when the power device will reach its failure threshold, allowing maintenance to be scheduled in advance during planned downtime rather than causing unexpected interruptions. This enables proactive replacement or maintenance scheduling that minimizes operational disruption.
Solution Approach 2:
The patent implements a feedback mechanism where temperature detection results are continuously fed back to update the prediction time period. This closed-loop system monitors actual temperature conditions and adjusts maintenance timing predictions accordingly, allowing for optimized maintenance scheduling that balances reliability improvement with minimal operational interruption. The feedback loop enables dynamic adjustment of maintenance plans based on real-time device conditions.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables the prediction of power device life, preventing sudden failures during radiography operations and reducing unnecessary radiation exposure by allowing for timely maintenance and avoiding the need for re-performing radiography procedures.
Implementation Method 1
a temperature sensor that detects temperature data
Data Source
AI summary
A medical apparatus includes a power device, a temperature sensor, a conversion processing unit and a prediction time period calculation unit. The temperature sensor detects temperature data. The conversion processing unit refers to temperature data obtained by the temperature sensor in a table in which at least one of temperature data for inside a case covering the power device and temperature data for a wire bonded to the power device is associated with data of actually measured temperatures, and obtains at least one of the temperature data for inside the case and the temperature data for the wire. The prediction time period calculation unit calculates a prediction time period until a failure of the power device based on the obtained temperature data.