Power Element Failure Detection via Dual Temperature Models

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Solution Overview

Problem

Existing methods for determining the failure of power elements in electronic devices are inaccurate due to uncertainties in lifespan estimation and temperature variations, leading to underestimation of damage and overestimation of lifespan, as they rely on fixed thermal network parameters and statistical fatigue curves that do not account for manufacturing variations and real-time thermal changes.

Innovation Solution

A method involving a temperature-calculation model and a parameterized temperature-calculation model is used to detect load information and power-element parameters, calculating both modeled and parameterized temperatures to determine if the error exceeds a permitted range, thereby accurately assessing power element failure.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If fixed thermal network parameters are used to calculate temperature, then calculation simplicity is improved, but measurement precision deteriorates due to aging-induced thermal resistance changes

Engineering Contradiction:
Improvecalculation model complexityVSAvoidtemperature measurement precision
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent transforms the fixed thermal network parameters into dynamic parameters that are continuously updated based on real-time temperature monitoring. The system periodically measures actual temperature under known load conditions and uses these measurements to update the thermal resistance and thermal capacitance values, making the calculation model adapt to aging-induced changes while maintaining computational efficiency

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent implements a feedback mechanism where the calculated temperature is continuously compared with actual temperature measurements. The difference between calculated and measured temperatures is used to adjust and update the thermal network parameters, creating a closed-loop system that self-corrects for aging effects and maintains precision without requiring complex real-time thermal modeling

Inventive Principle:
Principle #23Feedback

2Ease of manufacture

If statistical fatigue curves are used for lifespan estimation, then ease of manufacture is improved, but reliability deteriorates due to manufacturing variations and operating condition differences

Engineering Contradiction:
Improvelifespan estimation method simplicityVSAvoidlifespan estimation accuracy
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent changes the approach from using fixed statistical fatigue curves to dynamically adjusting the fatigue assessment based on actual operating parameters. The system continuously monitors temperature, load conditions, and cycle counts, and updates the damage accumulation calculation using real-time parameter values rather than relying solely on pre-established statistical curves, thereby accounting for actual manufacturing variations and operating condition differences

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent performs preliminary calibration by establishing the relationship between operating conditions and fatigue damage before actual operation. The system pre-determines the fatigue curve parameters for different operating conditions and stores them for quick reference during operation, enabling accurate real-time fatigue assessment without requiring complex real-time analysis while maintaining reliability across manufacturing variations

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS11002782B2Method for determining failure of power element and electronic device thereof
Publication Date: 2021.05.11 DELTA ELECTRONICS INC(CN)
  • US11002782B2 patent drawing
  • US11002782B2 patent drawing
  • US11002782B2 patent drawing

AI summary

A method for determining failure of a power element for use in an electronic device is provided. The electronic device includes a power element and a detection circuit. The method includes the steps of: obtaining a temperature-calculation model of the power element, and obtaining a parameterized temperature-calculation model of a power-element parameter and a parameterized temperature of the power element; detecting load information and the power-element parameter by the detection circuit; calculating a modeled temperature of the power element according to the load information and the temperature-calculation model, and calculating the parameterized temperature of the power element according to the power-element parameter and the parameterized temperature-calculation model; determining whether an error between the modeled temperature and the parameterized temperature exceeds a permitted range; and determining that the power element has failed in response to the error exceeding the permitted range.