Power Gate Ramp-Up Bias Control for Reliable Fast Wake-Up

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Solution Overview

Problem

The initial ramp-up current of power gate transistors causes self-heating issues and reliability concerns due to excessive temperature rise, violating metal reliability limits and constraints across process, voltage, and temperature (PVT) ranges, limiting the minimum and maximum size of power gate transistors that can be turned on.

Innovation Solution

Dividing the array of power gate transistors into slices and using digital control to progressively turn them on with discrete ramp-up biases, maintaining a constant or near-constant current to avoid violating performance parameters, and switching to a ground bias once the target voltage is reached, allowing for faster ramp-up times while ensuring reliability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of time

If the power gate transistor is turned on quickly to reduce latency, then the ramp-up time is reduced, but the initial ramp-up current causes self-heating issues and violates metal reliability limits

Engineering Contradiction:
Improveramp-up timeVSAvoidmetal reliability
Core Design Contradiction:
Loss of timeVSReliability

Solution Approach 1:

The power gate transistor array is divided into multiple slices (first slice, second slice, third slice) that are activated sequentially rather than simultaneously. This segmentation allows the total ramp-up current to be distributed over time, reducing the peak current stress on any single slice while maintaining overall fast activation. The controller activates slices in a controlled sequence, achieving both fast response and reliability.

Inventive Principle:
Principle #1Segmentation

2Power

If the power gate transistor size is increased to provide higher current, then the power delivery capability is improved, but the initial ramp-up current exceeds safe levels causing self-heating

Engineering Contradiction:
Improvepower delivery capabilityVSAvoidself-heating temperature
Core Design Contradiction:
PowerVSTemperature

Solution Approach 1:

The power gate transistor array is divided into multiple slices that are activated sequentially. This allows the total power delivery capability to be maintained through the combined capacity of all slices, while the sequential activation ensures that the current through any individual slice remains within safe temperature limits. The controller manages the activation sequence to balance power delivery with thermal constraints.

Inventive Principle:
Principle #1Segmentation

3Temperature

If the ramp-up current is limited to prevent self-heating, then the temperature control is improved, but the ramp-up time increases due to slower current increase

Engineering Contradiction:
Improveself-heating temperatureVSAvoidramp-up time
Core Design Contradiction:
TemperatureVSLoss of time

Solution Approach 1:

The power gate transistor array is divided into multiple slices activated sequentially at controlled time intervals. This segmentation enables the ramp-up current to be maintained within safe temperature limits for each slice while achieving fast overall activation through parallel slice activation. The controller optimizes the activation timing to balance temperature control with minimal ramp-up time.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The controller pre-plans and executes a sequential activation sequence for the power gate slices. By preparing and executing this predetermined sequence, the system achieves optimal ramp-up performance that balances temperature constraints with speed requirements, avoiding both excessive heating and unnecessarily slow activation.

Inventive Principle:
Principle #10Preliminary action

4Power

If the power gate transistor size is increased to provide higher current, then the power delivery is improved, but the maximum current causes excessive droop on the ungated power supply node

Engineering Contradiction:
Improvepower deliveryVSAvoidpower supply stability
Core Design Contradiction:
PowerVSReliability

Solution Approach 1:

The power gate transistor array is divided into multiple slices that are activated sequentially rather than simultaneously. This segmentation distributes the total current draw over time, preventing excessive instantaneous current that would cause droop on the ungated power supply node. The controller manages the activation sequence to maintain power supply stability while achieving the required power delivery capability.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentEP3602761B1Power gate RAMP-up control apparatus
Publication Date: 2023.09.06 INTEL CORP
  • EP3602761B1 patent drawingFigure 1
  • EP3602761B1 patent drawingFigure 2
  • EP3602761B1 patent drawingFigure 3

AI summary

An apparatus is provided which comprises: a power gate device coupled to a gated power supply node and an ungated power supply node; and a control circuitry coupled to the power gate device, wherein the control circuitry is to turn on the power gate device by providing at least two bias voltages separated in time to gradually turn on the power gate device.