Power Gating Body Bias Tuning for Standby Power Cutoff
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Solution Overview
Problem
Existing power gating techniques in portable electronics fail to optimize operation performance and current consumption effectively, as they do not efficiently manage power supply to function blocks in standby mode, leading to unnecessary power consumption.
Innovation Solution
A power gating control system and method that includes a semiconductor apparatus with logic circuit blocks coupled through power gating transistors and switches, where a tester adjusts body bias values and switch combinations to optimize power gating, determining optimal body bias and switch configurations through testing to minimize power consumption while maintaining performance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of energy
If power gating is applied to function blocks in standby mode, then power consumption is reduced, but operation performance and current consumption optimization is insufficient
Solution Approach 1:
The patent applies body bias voltage adjustment to change the electrical characteristics of power gating transistors. By dynamically adjusting the body bias voltage, the transistor threshold voltage is modified, enabling optimization of both power consumption and operation performance. The tester systematically varies body bias values to find optimal settings that balance power savings with functional performance requirements.
Solution Approach 2:
The patent introduces dynamic control of power gating transistors through adjustable body bias voltage rather than static on/off control. This dynamic approach allows the system to adapt power gating characteristics to different operational conditions, achieving both power reduction in standby mode and performance maintenance when needed.
2Loss of energy
If body bias value is changed to optimize power gating, then power consumption is reduced, but test coverage and optimization accuracy are insufficient without systematic testing
Solution Approach 1:
The patent performs preliminary systematic testing of body bias values before final optimization. The tester pre-tests multiple body bias configurations to identify promising candidates, then performs refined testing on selected candidates. This preliminary action ensures comprehensive coverage of the parameter space and prevents premature convergence on suboptimal settings.
Solution Approach 2:
The patent implements a feedback mechanism where test results from logic circuit block operations are used to adjust and refine body bias value selection. The tester monitors operational performance and power consumption metrics, then uses this feedback to iteratively improve the body bias configuration, ensuring both power optimization and performance requirements are met.
3Adaptability or versatility
If multiple switches are used for power gating control, then power management flexibility is improved, but device complexity increases
Solution Approach 1:
The patent divides the power gating control into multiple independently controllable switches, each managing specific logic circuit blocks. This segmentation allows selective power gating of individual blocks or groups of blocks, providing fine-grained power management flexibility. Each switch can be controlled independently based on the operational requirements of its associated logic blocks.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system optimizes operation performance and current consumption by determining and applying optimal body bias values and switch configurations, enhancing power cutoff capability in standby mode without degrading normal mode performance.
Implementation Method 1
a test for the logic circuit block may be performed by using test data while changing a body bias value of the power gating transistor
Data Source
AI summary
A power gating control system may be provided. The power gating control system may include a semiconductor apparatus including a logic circuit block which is coupled with a power supply terminal through a power gating transistor. The power gating control system may include a tester configured to control the semiconductor apparatus such that a test for the logic circuit block is performed by using test data while changing a body bias value of the power gating transistor, and update a body bias value satisfying a predetermined test condition, in the semiconductor apparatus.