Power Glitch Detection Circuit in Integrated Circuits
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Solution Overview
Problem
Integrated circuits (ICs) face soft failures due to power transients or glitches in supply voltage, which can cause momentary drops, leading to incorrect operation or failure, even if the components are not faulty, and existing testing methods struggle to identify the location and magnitude of these glitches effectively.
Innovation Solution
A detection circuit within the IC, comprising a voltage comparator and a flip-flop, is used to detect when the supply voltage falls below a reference voltage, triggering a logic signal that is stored in a register, allowing for the identification of glitch locations and potentially determining the glitch magnitude by varying the reference voltage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If detection circuits are added to detect power glitches, then the ability to detect and locate voltage transients is improved, but the device complexity increases
Solution Approach 1:
The IC is divided into multiple regions, each with its own detection circuit (voltage comparator and flip-flop combination). This segmentation allows localized detection of power glitches in different parts of the circuit, improving measurement precision while keeping each individual detection unit relatively simple.
Solution Approach 2:
The detection circuit uses standard, widely-available components (voltage comparators and flip-flops) that can be replicated across multiple locations. These components serve multiple functions: voltage comparison, threshold detection, and glitch indication, providing a universal solution that balances detection capability with circuit simplicity.
2Loss of information
If multiple detection circuits are placed at different locations to identify glitch locations, then the information completeness is improved, but the device complexity increases
Solution Approach 1:
The IC is divided into multiple regions, each with its own detection circuit (voltage comparator and flip-flop combination). This segmentation allows localized detection of power glitches in different parts of the circuit, improving measurement precision while keeping each individual detection unit relatively simple.
Solution Approach 2:
Instead of using a single complex detection system, the patent replicates simple detection circuits (comparator + flip-flop) at multiple strategic locations throughout the IC. Each location has an identical copy of the detection circuitry, which simplifies the overall design while providing comprehensive coverage for locating power glitches.
3Measurement precision
If voltage comparators and flip-flops are used for detection, then the detection accuracy is improved, but the manufacturing complexity increases
Solution Approach 1:
Instead of using a single complex detection system, the patent replicates simple detection circuits (comparator + flip-flop) at multiple strategic locations throughout the IC. Each location has an identical copy of the detection circuitry, which simplifies the overall design while providing comprehensive coverage for locating power glitches.
Solution Approach 2:
The reference voltage level can be adjusted to detect different magnitudes of power glitches. This parameter changeability allows the same detection circuit design to be used for various detection thresholds, maintaining manufacturing simplicity while adapting to different detection requirements.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables accurate detection and localization of power glitches, facilitating improved IC design and failure analysis, and aiding in refining the IC's operation by providing detailed information on glitch occurrences and conditions during testing and post-silicon use.
Implementation Method 1
The voltage comparator may receive the supply voltage on one input, and the reference voltage on another input
Implementation Method 2
The output of the comparator may be coupled to a clock input of the flip-flop... the flip-flop may correspondingly change the state of its output signal
Data Source
AI summary
A method and apparatus for power glitch detection in IC's is disclosed. In one embodiment, a method includes a detection circuit in an IC detecting a voltage transient wherein a value of a supply voltage has at least momentarily fallen below a reference voltage value. Responsive thereto, the detection circuit may cause a logic value to be stored in a register indicating that the detection circuit has detected the supply voltage falling below the reference voltage. The IC may include a number of detection circuits coupled to the register, each of which may provide a corresponding indication of detecting the supply voltage falling below the reference voltage. The detection circuits may be placed at different locations, and thus reading the register may yield information indicating the locations where, if any, such voltage transients occurred.