Power Loss Test Apparatus for Nonvolatile Memory

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Solution Overview

Problem

Conventional power loss tests for non-volatile memory devices are inefficient as they randomly cut off power without considering the internal operating state, leading to potential data and meta-data loss during critical operations like write and garbage collection.

Innovation Solution

A power loss test apparatus and method that utilize a microcontroller to monitor current consumption and operating state information to selectively cut off power only during important operations such as garbage collection, reducing test runtime and improving reliability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If power is randomly cut off during write operations, then the power loss test can be performed, but data and meta-data may be lost causing errors

Engineering Contradiction:

Improvereliability-in useVSAvoiddata loss

Core Design Contradiction:

ReliabilityVSLoss of information

Solution Approach 1:

The micro controller monitors the operating state of the non-volatile memory device before cutting off power. It identifies critical operations (such as garbage collection) in advance and selectively cuts off power only during these important operations, preventing data loss while maintaining test reliability

Inventive Principle:

Principle #10Preliminary action

2Reliability

If power is randomly cut off during operations, then the power loss test can be performed, but the test runtime increases due to inefficient testing

Engineering Contradiction:

Improvereliability-in useVSAvoidtest runtime

Core Design Contradiction:

ReliabilityVSLoss of time

Solution Approach 1:

The system dynamically adjusts the power cutting strategy based on the real-time operating state of the non-volatile memory device. By monitoring current consumption patterns and identifying critical operations, the system selectively cuts off power only when necessary, optimizing the test runtime while maintaining reliability

Inventive Principle:

Principle #15Dynamics

Solution Approach 2:

The micro controller continuously monitors the operating state and current consumption of the non-volatile memory device during the test. This feedback mechanism enables the system to identify critical operations and adjust power cutting timing accordingly, improving test efficiency

Inventive Principle:

Principle #23Feedback

3Ease of operation

If conventional random power cutting is used, then the test is simple to implement, but it cannot consider the internal operating state of the memory device

Engineering Contradiction:

Improvetest implementation simplicityVSAvoidoperating state consideration

Core Design Contradiction:

Ease of operationVSMeasurement precision

Solution Approach 1:

The non-volatile memory device provides its own operating state information (such as current consumption patterns and operation type) to the micro controller during the test. This self-service approach enables precise identification of critical operations without adding complex external monitoring equipment, maintaining ease of implementation while improving measurement precision

Inventive Principle:

Principle #25Self-service

Data Source

PatentUS10008288B2Power loss test device and method for nonvolatile memory device

Publication Date: 2018.06.26 ELIXIR FLASH TECH

AI summary

A power loss test apparatus for a non-volatile memory device includes a test-board including at least one socket into which at least one test target non-volatile memory device is inserted, a micro controller that determines whether to supply power to the test target non-volatile memory device based on current consumption information or operating state information of the test target non-volatile memory device, and a tester that performs a power loss test for the test target non-volatile memory device based on whether the power is supplied to the test target non-volatile memory device.