Storage Drive Power Noise Testing With Relay-Switched Injection Paths

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Solution Overview

Problem

Current power noise susceptibility tests for storage devices, such as HDDs and SSDs, require manual operation, are prone to human errors, and can only test one device at a time, making them inefficient and difficult to scale for full frequency bandwidth coverage.

Innovation Solution

An automated power noise susceptibility test system using multiple relays, operational amplifiers, and power amplifier injection circuits to selectively provide noise to storage devices across various frequency bands, eliminating the need for manual setup and enabling simultaneous testing of multiple devices.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If manual power noise susceptibility testing is used, then the testing process is simple to understand, but it requires manual operation, is prone to human errors, and can only test one device at a time

Engineering Contradiction:
Improvetesting throughputVSAvoidsystem complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The testing system is divided into multiple independent noise injection modules, each capable of testing one storage device. Multiple modules can operate simultaneously to test multiple devices in parallel, thereby increasing throughput while maintaining modular simplicity

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Each noise injection module is designed with universal functionality to handle various frequency bands (low frequency path with capacitor injection circuit and high frequency path with power amplifier injection circuit) and different power supply voltages, allowing a single module to perform multiple testing functions

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Adaptability or versatility

If manual testing is used, then the setup is straightforward, but it is inefficient and difficult to scale for full frequency bandwidth coverage

Engineering Contradiction:
Improvefrequency bandwidth coverageVSAvoidtesting time
Core Design Contradiction:
Adaptability or versatilityVSLoss of time

Solution Approach 1:

The system includes dynamic switching mechanisms using relays (first relay for path selection, second relay for frequency band selection, third relay for noise function selection) that automatically configure the testing path based on the required frequency band, enabling full frequency bandwidth coverage without manual reconfiguration

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The system pre-configures multiple paths (low frequency path with capacitor injection circuit and high frequency path with power amplifier injection circuit) and noise functions before testing begins, allowing immediate switching between different frequency bands and reducing setup time

Inventive Principle:
Principle #10Preliminary action

3Reliability

If automated testing with multiple paths is implemented, then full frequency bandwidth coverage is achieved, but the device complexity increases

Engineering Contradiction:
Improvetesting accuracyVSAvoidcircuit complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

Different parts of the system are optimized for specific frequency ranges: the capacitor injection circuit is optimized for low frequency noise injection, while the power amplifier injection circuit is optimized for high frequency noise injection. This localized optimization improves testing accuracy for each frequency band while managing overall complexity

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS11880252B2Automated power noise susceptibility test system for storage device
Publication Date: 2024.01.23 SK HYNIX INC
  • US11880252B2 patent drawing
  • US11880252B2 patent drawing
  • US11880252B2 patent drawing

AI summary

Automated power noise susceptibility test systems are provided for one or more storage devices. A system includes a host; storage devices; and multiple noise injection modules. Each noise injection module includes: a first relay to a third relay, which are coupled to a first path or a second path. The first path includes: an operational amplifier for generating a high noise function; a first variable regulator for generating a first or second regulated power supply voltage; and a capacitor injection circuit for generating low noise function and a first power noise. The second path includes: a second variable regulator for generating a third or fourth regulated power supply voltage and a power amplifier injection circuit for generating a second power noise. The third relay selectively provides the storage device the first power noise or the second power noise.