Power Probe for Simultaneous Voltage and Current Measurement
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Solution Overview
Problem
Conventional test instruments face challenges in accurately measuring power due to skew errors between voltage and current measurements, which are often taken at different physical locations on a device under test, leading to inaccuracies and limited bandwidth.
Innovation Solution
A power probe is designed to simultaneously measure current and voltage waveforms at a specific circuit location of a device under test, incorporating a sensor and detection circuits to minimize skew errors and provide independent output of power, current, or voltage signals, with optional deskew circuits for precise time alignment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If conventional voltage and current probes are used to measure at different physical locations, then measurement coverage is improved, but skew error increases
Solution Approach 1:
The patent combines voltage sensing and current sensing capabilities into a single power probe that contacts the DUT at one physical location. The probe includes a voltage sensing circuit coupled to a contact point and a current sensing circuit that measures current through the same contact point, eliminating the skew error caused by measuring at separate locations while maintaining comprehensive measurement coverage.
2Adaptability or versatility
If separate voltage and current probes are used, then measurement flexibility is improved, but device complexity increases
Solution Approach 1:
The power probe is designed as a universal measurement tool that can simultaneously perform voltage measurement, current measurement, and power calculation through a single device. The probe includes a voltage sensing circuit, a current sensing circuit, and a processor that can output voltage waveforms, current waveforms, and power waveforms, eliminating the need for multiple separate probes while maintaining measurement flexibility.
3Adaptability or versatility
If conventional test instruments with multiple inputs are used, then measurement capability is improved, but bandwidth is limited
Solution Approach 1:
The patent combines voltage sensing and current sensing circuits within a single probe device with a unified processor that simultaneously processes both signals. This integrated approach allows both measurement functions to operate at the full bandwidth of the probe's electronic components rather than being limited by the sequential or coordinated operation of separate instruments, thereby improving overall bandwidth while maintaining comprehensive measurement capability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables accurate, high-bandwidth measurement of power and reduces the number of required test instrument channels, improving measurement precision and efficiency by integrating current and voltage detection functions into a single probe, thus minimizing skew errors and enhancing measurement accuracy.
Implementation Method 1
a sensor connected to each of the probe inputs for detecting current and voltage at the signal probe points of the DUT
Implementation Method 2
a sensor connected to each of the probe inputs for detecting current and voltage at the signal probe points of the DUT
Data Source
AI summary
A probe is connectable to a test instrument for measuring signals of a DUT, where the probe includes a probe head that includes multiple leads configured to connect to signal probe points of the DUT, and a sensor connected between two of the leads; at least one probe output configured to connect to the test instrument; a current detection circuit configured to detect current of the DUT through the sensor, and to provide a detected current signal; a voltage detection circuit configured to detect voltage of the DUT between the sensor and ground, and to provide a detected voltage signal; a combiner configured to combine the detected current signal and the detected voltage signal, and to provide a power signal indicating power of the DUT; and switches configured to selectively output at least one of the detected current signal, the detected voltage signal, and the power signal.