Switching Power Supply Built-In Testing Circuit
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Solution Overview
Problem
Existing power supply systems lack effective built-in testing mechanisms to monitor and verify the functionality of their internal circuits, particularly in switching power supplies, which can lead to undetected failures and potential system shutdowns due to unregulated input or output voltages and currents.
Innovation Solution
A power supply assembly with integrated monitoring circuits and a processing circuit that performs built-in tests (BITs) by adjusting threshold values and power levels to detect and verify the functionality of monitoring circuits, determining whether a reset operation is successful, and taking appropriate actions based on the test results.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If built-in testing mechanisms are added to power supply systems, then reliability is improved, but device complexity increases
Solution Approach 1:
The patent combines the monitoring circuit and processing circuit into an integrated testing system within the power supply assembly. The monitoring circuit detects power characteristics while the processing circuit performs built-in tests, merging multiple functions into a unified structure that improves reliability without proportionally increasing complexity
Solution Approach 2:
The processing circuit serves multiple functions: it controls the monitoring circuit to perform built-in tests, determines test success based on reset detection, and coordinates testing across different power characteristics. This multi-functionality reduces the need for separate dedicated testing components
2Measurement precision
If monitoring circuits are added to detect power characteristics, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The monitoring circuit automatically detects power characteristics and provides data to the processing circuit for built-in testing. The system performs self-diagnosis by using its own monitoring capabilities to test itself, eliminating the need for external testing equipment and reducing overall system complexity
Data Source
AI summary
A disclosed system includes a switching power supply including a switching circuit and one or more monitoring circuits configured to monitor one or more power characteristics of the switching power supply, and a processing circuit configured to control the one or more monitoring circuits to perform a built-in test (BIT) of the one or more monitoring circuits.