Peak Power Management Self-Check Connectivity Validation
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Solution Overview
Problem
Existing peak power management systems in memory sub-systems cannot validate the connectivity and functionality of Peak Power Management (PPM) components after assembly or during the lifetime of the memory device, leading to potential failures and decreased performance.
Innovation Solution
Implementing a self-check mechanism within the PPM system using existing signal connections to verify the proper connectivity and operation of PPM components across memory devices, by propagating test values and comparing them to expected values stored in registers, allowing for quick validation without requiring a full test mode or external system-level controllers.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a self-check mechanism is implemented using existing signal connections, then the reliability of PPM components is improved, but the device complexity increases
Solution Approach 1:
The PPM component performs self-diagnosis by autonomously propagating test values through existing signal connections and comparing received values against expected values stored in registers, enabling the system to self-validate without external testing equipment
Solution Approach 2:
Existing signal connections are dual-used for both normal PPM operations and self-check operations, eliminating the need for dedicated test circuits while achieving connectivity validation functionality
2Measurement precision
If full test mode with external system-level controllers is used, then the measurement precision of connectivity is improved, but the loss of time and productivity deteriorates
Solution Approach 1:
The self-check mechanism extracts and utilizes existing signal connections and registers for testing purposes, eliminating the need for external testing equipment and full test mode while maintaining validation accuracy
Solution Approach 2:
Expected test values are pre-stored in registers during manufacturing, enabling rapid self-validation during operation without requiring external controllers or time-consuming setup procedures
Data Source
AI summary
A memory device includes a first memory die of a plurality of memory dies, the first memory die comprising a first memory array and a first power management component, wherein the first power management component is configured to send a first test value to one or more other power management components on one or more other memory dies of the plurality of memory dies during a first power management cycle of a first power management token loop. The memory device further includes a second memory die of the plurality of memory dies, the second memory die comprising a second memory array and a second power management component, wherein the second power management component is configured to receive the first test value from the first power management component during the first power management cycle of the first power management token loop and send a second test value to the one or more other power management components on the one or more other memory dies of the plurality of memory dies during a second power management cycle of a second power management token loop. At least one of the first power management component or the second power management component is configured to compare the first test value and the second test value to a set of expected values to determine whether signal connections between the first power management component and the second power management component are functional.