Per-Pin Measurement Unit State Machine Control
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Solution Overview
Problem
Current automatic test equipment (ATE) systems face challenges in accurately and efficiently obtaining and processing data from multiple pins of devices under test (DUT) at precise intervals, which is crucial for detecting faulty components early in the manufacturing process, especially when testing integrated circuits at the wafer level.
Innovation Solution
The proposed ATE system incorporates a per-pin measurement unit (PPMU) controlled by a state machine and programmable logic, including an analog-to-digital converter (ADC) and digital-to-analog converter (DAC), which allows for synchronized data retrieval and sourcing at programmable intervals, enabling precise waveform reconstruction and noise measurement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If data is obtained from multiple pins simultaneously at high speed, then productivity is improved, but measurement precision deteriorates due to timing synchronization challenges
Solution Approach 1:
The system divides the testing process into discrete time slots or cycles, where data from multiple pins is obtained in sequential segments rather than truly simultaneous operations. The state machine controls the PPMU to sample different pin groups in alternating time slots, ensuring that each sampling operation maintains precise timing while collectively achieving high-speed multi-pin testing.
2Measurement precision
If data sampling interval is reduced to capture more details, then measurement precision is improved, but loss of time increases due to more frequent sampling operations
Solution Approach 1:
The system implements periodic sampling with programmable intervals, where the state machine controls the PPMU to obtain data at regular time cycles. This periodic operation allows the system to capture sufficient waveform details for accurate reconstruction while maintaining an optimized sampling rate that prevents excessive testing duration. The interval can be adjusted based on the specific testing requirements.
3Measurement precision
If complex signal processing is performed to improve noise measurement accuracy, then measurement precision is improved, but device complexity increases due to additional processing requirements
Solution Approach 1:
The PPMU incorporates built-in signal processing capabilities directly within the measurement unit itself, allowing it to perform noise measurement and signal analysis functions autonomously. The unit processes the raw data it collects through internal algorithms to extract noise characteristics and signal parameters, eliminating the need for separate complex external processing equipment while maintaining high measurement precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables accurate and efficient testing of DUTs by allowing precise data sampling and signal processing, reducing the need to discard valuable components by detecting defects early in the manufacturing process, thereby saving costs associated with packaging defective parts.
Implementation Method 1
an analog-to-digital converter (ADC) between the logic and the PPMU, the ADC for servicing one or multiple PPMUs including the PPMU
Implementation Method 2
The PPMU may comprise a digital-to-analog converter and the memory stores signal data; and the logic may be configured to send the signal data to the memory, and the PPMU is configured to generate an AC waveform for delivery to the DUT based on the signal data
Data Source
AI summary
Example automatic test equipment (ATE) includes: a per-pin measurement unit (PPMU); logic configured to execute a state machine to control the PPMU; memory that is part of, or separate from, the logic; and a control system to command the logic; where, in response to a command from the control system, the state machine is configured to obtain, at a known interval or ATE event, data that is based on an output of a measurement by the PPMU and to store the data in the memory, or to output data to the PPMU from the memory at a known interval or synchronous to an event.