Preamplifier Switching Circuit for In-Situ Disk Head Fault Isolation
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Solution Overview
Problem
Conventional disk devices require disassembly to determine whether an abnormality detected by the preamplifier is due to the structural element or the abnormality detecting circuit, increasing the number of processes needed for analysis.
Innovation Solution
Incorporation of an abnormality detecting circuit connected to a structural element, a reference resistance element with a corresponding resistance value, and a switching circuit that can switch between connected and disconnected states, allowing for analysis without disassembly by determining if the abnormality is in the structural element or the detecting circuit.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the disk device is disassembled to analyze the abnormality, then the source of the abnormality (structural element or detecting circuit) can be identified, but the number of processes and time required for analysis increases
Solution Approach 1:
The patent applies preliminary action by pre-configuring a switching circuit that can connect the abnormality detecting circuit to either the structural element or a reference element before analysis is needed. When an abnormality is detected, the switching circuit can immediately switch to connect the reference element, allowing direct comparison without disassembly. This preliminary setup of the switching mechanism enables rapid abnormality source identification while maintaining high measurement precision.
2Measurement precision
If the disk device is disassembled to analyze the abnormality, then the abnormality source can be determined, but the device complexity and number of components increase
Solution Approach 1:
The patent merges the structural element and reference element into a unified circuit configuration controlled by a single switching circuit. Both elements share the same abnormality detecting circuit and connection pathways, allowing the system to analyze abnormalities by switching between elements rather than through physical disassembly. This merging reduces device complexity by eliminating the need for separate analysis circuits while maintaining the ability to precisely identify abnormality sources.
3Productivity
If a reference resistance element is added to enable in-situ analysis, then the number of analysis processes is reduced, but the preamplifier circuit complexity increases
Solution Approach 1:
The patent applies universality by designing the switching circuit to serve multiple functions: it normally connects the structural element to the abnormality detecting circuit for operational monitoring, and can switch to connect the reference element for rapid abnormality source analysis. The reference resistance element is designed with the same electrical characteristics as the structural element, allowing it to function as a substitute during analysis. This multi-functionality increases productivity by enabling in-situ analysis without requiring separate analysis equipment or procedures.
Data Source
AI summary
A preamplifier is included in a head assembly of a disk device. The preamplifier includes: an abnormality detecting circuit connected to a structural element included in a head device of the head assembly; a reference resistance element having a resistance value corresponding to the resistance value of the structural element and connected to the abnormality detecting circuit; and a switching circuit switchable to a first state and a second state. The first state is a state in which the abnormality detecting circuit and the structural element are connected to each other, and the abnormality detecting circuit and the reference resistance element are disconnected. The second state is a state in which the abnormality detecting circuit and the reference resistance element are connected to each other, and the abnormality detecting circuit and the structural element are disconnected.