Predictive Metrology Model Weighting for Stable Output Data
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Solution Overview
Problem
Machine-learning models used in electronic device manufacturing experience fluctuations in output data, leading to errors in predictive metrology, which can result in defective substrates.
Innovation Solution
The system generates a characteristic sequence defining the relationship between manufacturing parameters and determines weights based on this sequence to apply to features, thereby training a machine-learning model to reduce output data fluctuations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a machine-learning model is trained using standard sensor data from manufacturing processes, then the model can generate predictive metrology data, but the output data exhibits fluctuations leading to errors
Solution Approach 1:
The system performs preliminary actions by generating characteristic sequences that define relationships between manufacturing parameters before training the machine-learning model. These sequences are used to determine weights for features, which are then applied to the sensor data prior to model training. This preliminary weighting process stabilizes the training data, preventing output fluctuations and improving both measurement precision and reliability of the predictive metrology data.
2Productivity
If sensor data is used directly as input to the machine-learning model, then the model can be trained quickly, but the predictive data contains errors due to unweighted features
Solution Approach 1:
The system performs preliminary actions by generating characteristic sequences that define relationships between manufacturing parameters before training the machine-learning model. These sequences are used to determine weights for features, which are then applied to the sensor data prior to model training. This preliminary weighting process stabilizes the training data, preventing output fluctuations and improving both measurement precision and reliability of the predictive metrology data.
Data Source
AI summary
An electronic device manufacturing system configured to obtain, by a processor, sensor data associated with a substrate manufacturing process performed in a process chamber. The sensor data is provided, as input data, to a machine learning model. The machine learning trained uses a weighted feature that reflects a relationship between one or more variables related to an initial feature and a characteristic sequence that defines a relationship between two or more manufacturing parameters. An output value of the machine learning model is obtained, the output value being indicative of metrology data.


