Pre-Silicon Test Program Integration for Faster Semiconductor Debugging
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Solution Overview
Problem
Current semiconductor device testing and debugging processes are inefficient, leading to errors and delays in product launch, particularly due to the need for iterative cycles between design and high-volume manufacturing, and the inability of existing reconfigurable test systems to effectively test and debug at reduced time.
Innovation Solution
A method and system for creating and debugging silicon production test programs using a pre-silicon test program, converting it from hardware description language to high-level programming language, integrating it with bench board and ATE test programs, and mapping API resources for testing and debugging on an emulation platform.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If test programs are applied after manufacturing (post-silicon), then manufacturing completeness is achieved, but debugging time and errors increase
Solution Approach 1:
The patent applies preliminary action by executing test programs on an emulation platform before silicon manufacturing (pre-silicon phase). This allows testing and debugging to occur in advance, identifying issues before physical device fabrication, thereby reducing post-manufacturing debugging time while maintaining testing completeness.
2Measurement precision
If conventional iterative cycles between designer and HVM test program development are used, then testing accuracy is improved, but time-to-market increases
Solution Approach 1:
The patent performs test program verification and validation in the pre-silicon emulation phase before silicon manufacturing. This preliminary testing identifies and resolves issues early, eliminating the need for multiple iterative cycles between design and HVM test program development, thereby maintaining testing accuracy while significantly reducing time-to-market.
Solution Approach 2:
The patent introduces an emulation platform as an intermediary between design and physical manufacturing. This intermediate testing environment allows for accurate test program validation without requiring repeated iterations with actual silicon devices, bridging the gap between design intent and physical implementation efficiently.
3Adaptability or versatility
If reconfigurable test systems are used for pre-silicon, post-silicon, and production testing, then testing versatility is improved, but testing time increases
Solution Approach 1:
The patent segments the testing process into distinct phases: pre-silicon emulation testing, post-silicon validation, and production testing. Each phase uses appropriate test programs and platforms, avoiding the need to run all tests sequentially on a single reconfigurable system, thereby maintaining comprehensive testing coverage while reducing total testing time.
Data Source
AI summary
The present disclosure relates to a method and a system for creating and debugging a silicon production test program for a semiconductor device. The method includes running a pre-silicon test program for testing a semiconductor device under test based on a plurality of test plan parameters. The method includes converting the pre-silicon test program from a hardware description language to a high-level programming language in response to determining that the pre-silicon test program is created in the hardware description language. The method includes integrating the pre-silicon test program with a bench board test program or an automated test equipment (ATE) test program, and mapping Application Programming Interface (API) resources available in the pre-silicon test program to one or more resources available in the bench board test program or the ATE test program during integration. The method includes testing and debugging the semiconductor device under test using an emulation platform.