Pressurized Modular Workstation for Low-Contamination Wafer Transfer

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Solution Overview

Problem

Current assembly line processes for semiconductor workpieces involve significant manual handling and movement between stations, leading to high overhead and inefficient use of resources, and operate at ambient air pressure which fails to produce satisfactory results.

Innovation Solution

A modular pressurized workstation with an internal material handling system that maintains consistent atmospheric pressure, integrating modular tools vertically to automate the transfer of semiconductor workpieces between stations, reducing manual intervention and optimizing tool placement for reduced cycle times and power consumption.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If manual handling is used to move semiconductor workpieces between stations, then flexibility in operation is maintained, but manufacturing overhead and processing time increase significantly

Engineering Contradiction:
Improvemanual handling flexibilityVSAvoidmanufacturing overhead
Core Design Contradiction:
Ease of operationVSProductivity

Solution Approach 1:

The system employs automated material handling equipment that autonomously transports semiconductor workpieces between processing stations without requiring manual intervention. The automated system serves itself by continuously moving substrates through the manufacturing process, eliminating the need for operators to physically handle and transfer workpieces between stations, thereby reducing manufacturing overhead while maintaining operational flexibility

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

Manual mechanical handling operations are replaced with automated material handling systems that use robotic manipulators and automated conveyors to transport semiconductor workpieces. This substitution eliminates the need for human operators to physically move substrates, reducing labor-intensive operations and manufacturing overhead while improving productivity

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Adaptability or versatility

If tools are spaced apart at different stations, then each tool can be independently optimized, but movement overhead and cycle time increase

Engineering Contradiction:
Improvetool independenceVSAvoidmovement overhead
Core Design Contradiction:
Adaptability or versatilityVSLoss of time

Solution Approach 1:

Multiple processing tools are integrated into a single unified processing chamber where they coexist in close proximity. The tools are arranged vertically or horizontally within the same pressurized environment, allowing automated material handling equipment to transfer semiconductor workpieces between stations without exiting the chamber. This merging eliminates the need for tools to be spaced apart at separate ambient pressure stations, reducing movement overhead and cycle time while maintaining tool independence through modular design

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

Tools are arranged in a vertical configuration rather than being spaced horizontally across separate stations. By utilizing the vertical dimension within the processing chamber, multiple tools can be positioned at different heights, allowing automated robotic systems to efficiently transfer workpieces between stations without requiring significant horizontal movement. This dimensional reorganization reduces travel distance and movement overhead while preserving tool independence

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Ease of operation

If ambient air pressure is used throughout the assembly line, then operational simplicity is maintained, but particle contamination increases

Engineering Contradiction:
Improveoperational simplicityVSAvoidparticle contamination
Core Design Contradiction:
Ease of operationVSObject-affected harmful factors

Solution Approach 1:

The processing chamber is filled with a controlled atmosphere that is either vacuum or filled with inert gas such as nitrogen or clean dry air at reduced pressure. This inert environment prevents particle generation and contamination during semiconductor processing operations. The automated material handling system operates within this controlled atmosphere, transferring workpieces between tools without exposing them to ambient air, thereby eliminating particle contamination while maintaining operational simplicity through integrated automation

Inventive Principle:
Principle #39Inert atmosphere (Inert environment)

Solution Approach 2:

The atmospheric pressure parameter is changed from ambient pressure to a controlled reduced pressure or vacuum environment within the processing chamber. This parameter change creates a clean atmosphere that prevents particle generation and contamination during processing. The system maintains this controlled pressure environment throughout the entire manufacturing process, eliminating the need to switch between ambient and cleanroom environments, thereby reducing particle contamination while preserving operational simplicity

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS20250210389A1Modular pressurized workstation
Publication Date: 2025.06.26 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US20250210389A1 patent drawing
  • US20250210389A1 patent drawing
  • US20250210389A1 patent drawing

AI summary

In an embodiment, a system, includes: a first pressurized load port interfaced with a workstation body; a second pressurized load port interfaced with the workstation body; the workstation body maintained at a set pressure level, wherein the workstation body comprises an internal material handling system configured to move a semiconductor workpiece within the workstation body between the first and second pressurized load ports at the set pressure level; a first modular tool interfaced with the first pressurized load port, wherein the first modular tool is configured to process the semiconductor workpiece; and a second modular tool interfaced with the second pressurized load port, wherein the second modular tool is configured to inspect the semiconductor workpiece processed by the first modular tool.