Test Pattern Divided Images for Printer Defect Localization
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Solution Overview
Problem
Conventional image formation apparatuses, such as printers, face difficulties in identifying defective parts even after checking the image of a test pattern, as the degradation in image quality is not clearly localized.
Innovation Solution
The image formation apparatus includes a storage for a test pattern with divided images formed by multiple image formation sections, where each divided image covers the entire width in both the main scanning and sub-scanning directions, allowing easy recognition of defective parts by checking the test pattern image.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a test pattern is printed using conventional image formation apparatus, then the image quality can be checked, but it is difficult to recognize which specific part of the apparatus has a defect
Solution Approach 1:
The test pattern is divided into multiple regions, with each region being formed by a specific image formation section. This segmentation allows operators to identify which specific section has a defect by observing which region shows image quality degradation, thereby resolving the contradiction between measurement precision and ease of operation.
2Ease of operation
If the test pattern is divided into regions formed by different image formation sections, then defect identification becomes easier, but the complexity of the test pattern structure increases
Solution Approach 1:
The test pattern is segmented into regions corresponding to different image formation sections, enabling easy defect identification while maintaining a relatively simple overall structure that does not significantly increase device complexity.
Solution Approach 2:
The divided test pattern structure serves multiple functions: it identifies defective sections, maintains comprehensive coverage of the printing area, and provides a clear visual indication of defects, thereby achieving ease of operation without proportionally increasing complexity.
3Measurement precision
If each divided image covers the entire width in main scanning and sub-scanning directions, then defect recognition becomes more accurate, but the total width requirement increases
Solution Approach 1:
The test pattern is divided into multiple regions that collectively cover the entire width in both main scanning and sub-scanning directions. Each region is formed by a specific image formation section, allowing accurate defect recognition while distributing the width coverage across multiple sections rather than requiring a single oversized image.
Data Source
AI summary
An image formation apparatus includes: a storage which stores a test pattern; and image formation sections which form an image of the test pattern on a medium. The image of the test pattern includes divided images formed by being divided into regions in a main scanning direction and a sub-scanning direction. Each of the divided images is formed by at least one preset image formation section out of the image formation sections. A total width, in each of the main scanning direction and the sub-scanning direction, of the divided images formed by each of the image formation sections is larger than the entirety of a corresponding width of the image of the test pattern.