Multifaceted Prism Adapter Tip for Angled-Polished Fiber Inspection
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Solution Overview
Problem
Existing optical-fiber connector endface inspection methods struggle to inspect angled-polished multifiber connectors in dense environments without disconnecting neighboring fibers, which increases the risk of contamination or damage.
Innovation Solution
An adapter tip with a multifaceted optical prism is used to realign inspection light from angled-polished optical-fiber endfaces, allowing the inspection microscope to remain in line with the connector while inspecting multiple endfaces simultaneously.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the inspection microscope is tilted at an 8-degree angle to inspect APC connectors, then the endface can be illuminated normally, but the inspection probe cannot be inserted in dense environments without disconnecting neighboring fibers
Solution Approach 1:
A beam splitter is introduced as an intermediary component between the illumination source and the angled endface. The beam splitter directs illumination light at the required 8-degree angle to the endface while allowing the inspection microscope to remain in a straight-line configuration with the connector, eliminating the need to tilt the entire microscope assembly.
Solution Approach 2:
The illumination path is separated from the inspection optical path by using a beam splitter. The illumination light travels along one dimensional path at an angle, while the inspection microscope maintains a different dimensional alignment (straight line with the connector), allowing both functions to coexist without mechanical conflict.
2Ease of operation
If a single-fiber adapter tip with lens arrangement is used to inspect APC connectors without tilting, then the microscope can remain in line, but only one fiber can be inspected at a time
Solution Approach 1:
The adapter tip is designed with a universal structure that can accommodate and inspect multiple fiber types (single-fiber, multi-fiber, duplex, APC, UPC) using the same straight-line microscope configuration. The beam splitter arrangement allows simultaneous illumination and inspection of multiple endfaces without requiring different adapter tip designs for each connector type.
Solution Approach 2:
Multiple fiber inspection capabilities are merged into a single adapter tip design. The adapter tip structure combines the functionality of handling different connector types while the beam splitter merges the illumination and inspection paths, allowing simultaneous inspection of multiple fibers through a single aligned microscope.
3Illumination intensity
If conventional tilting method is used for APC inspection, then proper illumination is achieved, but neighboring fibers must be disconnected in dense patch panels
Solution Approach 1:
The beam splitter acts as a mediator that decouples the illumination angle requirement from the microscope positioning requirement. It enables the illumination light to strike the angled endface at the optimal 8-degree angle while the microscope itself maintains a straight-line configuration that does not interfere with neighboring fiber connections in dense patch panels.
Solution Approach 2:
The illumination function is segmented from the inspection function. The beam splitter separates the illumination light path from the inspection optical path, allowing independent optimization of each function - illumination at 8 degrees and inspection in straight line - without compromising fiber connection integrity in dense environments.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables the inspection of angled-polished multifiber connectors in dense environments without disconnecting neighboring fibers, maintaining the integrity of the optical connections and preventing contamination.
Implementation Method 1
relay optics comprising a multifaceted optical prism defining a first reflecting plane surface, a second reflecting plane surface and a third reflecting plane surface, used to realign inspection light coming from the endface(s) through reflection of the illumination light
Data Source
AI summary
There is provided an adapter tip to be employed with an optical-fiber connector-endface inspection microscope device and an optical-fiber connector endface inspection microscope system suitable for imaging angled-polished optical-fiber endface(s) of an optical-fiber connector. The proposed adapter tip or microscope system comprises relay optics comprising a multifaceted optical prism defining a first reflecting plane surface, a second reflecting plane surface and a third reflecting plane surface, used to deflect inspection light coming from the endface(s) through reflection of illumination light—referred to hereinafter as the object beam—towards and substantially in line with the optical axis of the objective lens of the optical-fiber connector-endface inspection microscope device.