Probabilistic Simulation of Microelectronic Devices

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Solution Overview

Problem

Current probabilistic simulation methods for microelectronic devices require substantial computing resources to achieve reliable results, necessitating a method to reduce computational load without compromising reliability.

Innovation Solution

A method that involves defining samples from a probability distribution of physical parameters, determining operating variables through electrical simulation, building a mathematical model, and using this model to estimate operating variables, while verifying precision conditions to iteratively improve the model's accuracy and reduce the number of necessary simulations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If brute force Monte Carlo simulation methods are used to ensure reliable probabilistic simulation results, then simulation reliability is improved, but computational load increases substantially

Engineering Contradiction:
Improvesimulation reliabilityVSAvoidcomputational load
Core Design Contradiction:
ReliabilityVSUse of energy by stationary object

Solution Approach 1:

The patent performs preliminary electrical simulations on a first set of samples to build a mathematical model that approximates the device response. This preliminary action allows subsequent simulations to use the pre-built model instead of performing full electrical simulations, thereby reducing computational load while maintaining reliability through iterative model refinement and precision verification.

Inventive Principle:
Principle #10Preliminary action

2Productivity

If the number of electrical simulations is reduced to decrease computational load, then computational efficiency is improved, but simulation precision deteriorates

Engineering Contradiction:
Improvecomputational efficiencyVSAvoidsimulation precision
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent implements a feedback mechanism where the mathematical model is iteratively refined based on precision verification. The model is updated using results from additional electrical simulations on second samples, and the process continues until the model meets a predefined precision condition. This feedback loop ensures that computational efficiency is improved while simulation precision is maintained through adaptive model refinement.

Inventive Principle:
Principle #23Feedback

3Use of energy by stationary object

If a mathematical model is built to approximate electrical simulation response, then computational load is reduced, but model precision must be verified iteratively

Engineering Contradiction:
Improvecomputational loadVSAvoidmodel verification complexity
Core Design Contradiction:
Use of energy by stationary objectVSDevice complexity

Solution Approach 1:

The patent introduces a mathematical model as an intermediary between the physical device and the simulation results. This model approximates the complex electrical simulation response, allowing rapid evaluation of device behavior. The intermediary model simplifies subsequent analyses while maintaining accuracy through iterative refinement, thereby reducing computational load without requiring overly complex verification procedures.

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS10878156B1Probabilistic simulation method of a microelectronic device
Publication Date: 2020.12.29 SILVACO FRANCE
  • US10878156B1 patent drawing
  • US10878156B1 patent drawing
  • US10878156B1 patent drawing

AI summary

The present disclosure relates to a method for probabilistic simulation of a microelectronic device, said method being implemented automatically by an electronic processing device and including the following steps:a) defining a plurality of first samples of the device from a probability distribution of at least one physical parameter of the device;b) for each first sample, determining, through an electrical simulation method, the value of at least one operating variable of the device;c) defining, by regression from values of the physical parameters and operating variables of the first samples simulated in step b), a mathematical model approximating the response of the electrical simulation method.