Probe Alignment Jig for Narrow-Pitch Circuit Board Joining
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Solution Overview
Problem
Existing electrical connection devices face challenges in precisely joining probes to circuit boards with a narrow pitch due to the narrower pitch of electrode terminals in objects to be inspected.
Innovation Solution
A manufacturing jig comprising a first and second guide plate with through holes, allowing probes to be inserted into guide parts that enable precise alignment and fixation on a circuit board, facilitating high-precision and narrow-pitch joining.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If conventional joining methods are used, then the manufacturing process is simple, but the positioning precision and alignment accuracy of probes on narrow-pitch circuit boards deteriorate
Solution Approach 1:
A positioning pin is introduced as an intermediary component between the probe and the circuit board. The positioning pin fits into a positioning hole to provide precise location reference, enabling accurate alignment without requiring complex direct joining mechanisms. This mediator component resolves the contradiction by achieving high positioning precision while maintaining relatively simple overall structure.
Solution Approach 2:
The invention replaces complex mechanical alignment systems with a simpler pin-hole positioning mechanism combined with clamping force. Instead of using elaborate mechanical guides or adjustment mechanisms, the system uses the geometric constraint of a pin fitting into a hole to define position, substituting complex mechanics with a straightforward geometric solution.
2Adaptability or versatility
If probes are joined at narrow pitch, then the electrical connection device can inspect higher-density objects, but the difficulty of precise alignment and joining increases
Solution Approach 1:
The positioning pin and positioning hole form a self-aligning system where the pin automatically finds its correct position when inserted into the hole. This self-service mechanism eliminates the need for complex external alignment tools or procedures, making narrow-pitch joining as easy as inserting the pin into the hole, thereby improving ease of manufacture while maintaining adaptability for high-density inspections.
Solution Approach 2:
The joining function is segmented into distinct components: the positioning pin for location, the positioning hole for reception, and the clamping mechanism for fixation. This segmentation allows each component to perform its specific function optimally, with the pin-hole pair handling alignment independently of the clamping action, thus simplifying the overall joining process for narrow-pitch applications.
3Productivity
If intermediate storage steps are eliminated, then manufacturing efficiency improves, but the complexity of the joining process increases
Solution Approach 1:
The positioning and clamping functions are merged into a single integrated operation. The positioning pin simultaneously provides location reference and serves as the element to be clamped, combining what would traditionally be separate positioning and securing steps into one unified action. This merging eliminates intermediate storage or transfer steps while the inherent simplicity of the pin-hole-clamp system prevents excessive complexity increase.
Data Source
AI summary
A manufacturing jig for an electrical connection device includes a jig including a first guide plate and a second guide plate each including a through hole penetrating from a first surface to a second surface, the first guide plate and the second guide plate laminated to be movable relative to each other along the first surface. The through hole includes a common portion extending in a first direction in a plan view, a first guide part extending from the common portion in a second direction different from the first direction, and a second guide part extending from the common portion in a third direction different from the first and second directions. The jig is configured so that probes can be inserted into each of the first guide part and the second guide part, through the first guide plate and the second guide plate successively.