Probe Alignment Mechanism for Stable Small-Component Measurement
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Solution Overview
Problem
Existing measuring devices struggle to stably measure the electrical characteristics of small components due to issues with gripping and positional alignment of probes, leading to inaccurate measurements.
Innovation Solution
The measuring device allows for adjustable relative positional relationships between the probes and the loading stand, enabling precise gripping of components through mechanisms that adjust the vertical, width, and inclination of the movable element, ensuring stable measurement even with small components.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the probes and loading stand have fixed relative positions, then the device structure is simple, but the component cannot be favorably gripped and measurement is unstable
Solution Approach 1:
The patent implements adjustability in the relative positional relationships between probes and loading stand through multiple adjustment mechanisms (vertical position adjustment, width adjustment, and inclination adjustment), transforming fixed structures into dynamically adjustable ones to achieve favorable gripping of components and stable measurement
Solution Approach 2:
The patent changes geometric parameters (vertical position, width, inclination angle) of the probes relative to the loading stand to optimize component gripping and measurement stability, allowing flexible adaptation to different component sizes and shapes
2Measurement precision
If the probes are fixed in position, then the device is easy to operate, but measurement precision deteriorates for small components
Solution Approach 1:
The patent introduces multiple adjustment mechanisms that allow operators to dynamically adjust probe positions (vertical, width, inclination) to precisely grip small components, thereby improving measurement precision while maintaining operational flexibility
Solution Approach 2:
The patent divides the positioning system into three independent adjustment segments (vertical position, width, inclination), allowing precise control of probe positions to achieve accurate measurement of small components
Data Source
AI summary
This is an improvement of a measuring device, for example, it is possible to stably measure an electrical characteristic even when a component is small. In the present measuring device, at least one of a relative positional relationship between a main body and a loading stand for holding the component and a relative positional relationship between the main body and at least one of a pair of probes can be adjusted. Therefore, the component held on the loading stand can be more favorably gripped by the pair of probes, and the electrical characteristic can be stably measured even when the component is small.