Probe Base Plate Alignment Using Standardized Spacer Thickness
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Solution Overview
Problem
Conventional electrical connecting apparatuses require cumbersome and error-prone adjustments of spacers and shims during probe base plate replacements, necessitating skilled trial and error for proper alignment and adjustment of probe tips, often leading to user frustration and the need for manufacturer intervention.
Innovation Solution
The apparatus employs standard spacer members and shims for initial alignment, allowing for precise adjustment and incorporation of new probe base plates without trial and error, using cylindrical spacers and shims to maintain alignment and correct inclination, enabling easy reassembly and reducing the need for manufacturer involvement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If conventional adjustment methods using spacers and shims are used during probe base plate replacement, then probe tip alignment can be achieved, but the adjustment process becomes cumbersome and time-consuming requiring skilled trial and error
Solution Approach 1:
The patent applies preliminary action by pre-adjusting the spacer thickness and shim thickness before probe base plate replacement. The control unit calculates the required spacer thickness based on the measured thickness of the probe base plate and the thickness of the previously used shim, allowing the user to directly install the calculated spacer without trial and error adjustments during replacement
Solution Approach 2:
The patent uses copying by storing the thickness information of the previously used shim in the control unit. This stored information is copied and used as a reference for calculating the new spacer thickness, eliminating the need to physically handle and measure the original shim again during replacement
2Manufacturing precision
If multiple adjustment components (spacers and shims) are used to achieve proper probe tip alignment, then alignment accuracy is improved, but the device complexity and number of parts increase
Solution Approach 1:
The patent merges the adjustment function into a single spacer component that replaces the traditional combination of multiple shims and spacers. The control unit calculates a single spacer thickness that incorporates both the alignment and height adjustment functions, reducing the number of parts while maintaining alignment accuracy
Solution Approach 2:
The patent changes the parameter approach by using a single variable (spacer thickness) instead of multiple variables (multiple shim thicknesses and spacer lengths). The control unit calculates the optimal spacer thickness based on the probe base plate thickness and stored reference information, simplifying the parameter management while achieving the same alignment precision
3Manufacturing precision
If trial and error adjustment methods are used for probe base plate replacement, then proper alignment can be achieved, but the time required for replacement increases significantly
Solution Approach 1:
The patent replaces the mechanical trial-and-error adjustment system with an automated calculation system. The control unit uses stored thickness information and simple arithmetic calculations to determine the exact spacer thickness needed, eliminating the time-consuming mechanical trial and error process while maintaining alignment precision
Solution Approach 2:
The control unit acts as an intermediary between the probe base plate thickness measurement and the spacer selection. It processes the thickness information, performs calculations based on stored reference data, and provides the exact spacer thickness specification, eliminating the need for user trial and error and significantly reducing replacement time
Data Source
AI summary
An electrical connecting apparatus includes a wiring base plate having a first surface coupled with a reinforcing plate and provided on an opposite surface with first electrical connection portions, a probe base plate provided on a first surface with second electrical connection portions corresponding to the first electrical connection portions and provided on a second surface with probes electrically connected to the second electrical connection portions, anchor portions formed on the first surface of the probe base plate and provided with screw holes, cylindrical spacers having first ends removably coupled with the anchor portions, having screw grooves, and passing through the wiring base plate and the reinforcing plate, reference plates having reference planes to receive the spacers and removably coupled with the reinforcing plate, shims inserted between the respective reference plates and the reinforcing plate, and bolt screwed in the screw groove of the spacer.