Probe Arm Length Recognition via Angular Deflection

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Solution Overview

Problem

Existing surface measuring apparatuses require manual adjustment of the measuring range after probe arm exchange, leading to potential measurement errors and risks of collision, and existing automated solutions are complex and costly or impractical due to size constraints.

Innovation Solution

The method automatically recognizes the length of the probe arm by measuring the angular deflection after a specified travel distance, allowing for automatic adjustment of the measuring range without additional hardware, using the existing hardware of the surface measuring apparatus.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If manual adjustment of measuring range is performed after probe arm exchange, then the operator can adjust the setting, but measurement errors occur when the operator forgets or makes incorrect adjustments

Engineering Contradiction:
Improvemanual adjustment capabilityVSAvoidmeasurement accuracy
Core Design Contradiction:
Ease of operationVSMeasurement precision

Solution Approach 1:

The system automatically detects the probe arm length and adjusts the measuring range without requiring operator intervention. The evaluation apparatus measures the angular deflection of the probe arm and automatically determines the correct measuring range, making the system self-sufficient and eliminating human error in the adjustment process.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The system uses feedback from the angular deflection measurement to automatically adjust the measuring range. By measuring the actual angular deflection and comparing it with expected values, the system identifies the probe arm length and automatically sets the correct measuring range, creating a closed-loop control system that ensures accuracy.

Inventive Principle:
Principle #23Feedback

2Extent of automation

If automated probe arm recognition using identification means (e.g., RFID chip) is implemented, then automatic recognition is achieved, but the probe arm becomes more expensive and cannot be attached to small-sized probe arms

Engineering Contradiction:
Improveautomatic probe arm recognitionVSAvoidadditional hardware requirements
Core Design Contradiction:
Extent of automationVSDevice complexity

Solution Approach 1:

The invention extracts the identification function from separate hardware components (like RFID chips) and integrates it into the existing probe arm geometry through angular deflection measurement. This eliminates the need for additional identification hardware while maintaining automatic recognition capability.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The system replaces electronic identification means (RFID chips) with a mechanical measurement approach using angular deflection of the probe arm. This substitution eliminates complex electronic hardware while achieving the same automatic recognition function through purely mechanical means.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If automated probe arm exchange and recognition system is implemented, then measurement accuracy is improved, but the device becomes complicated and costly to manufacture

Engineering Contradiction:
Improvemeasurement accuracyVSAvoidsystem complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The evaluation apparatus performs multiple functions: it measures angular deflection for probe arm length identification, determines the correct measuring range, and controls the measurement process. This multi-functionality eliminates the need for separate automated exchange and recognition systems, reducing overall device complexity while maintaining accuracy.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The system uses its existing measurement capabilities to automatically identify the probe arm and adjust settings, making the system self-sufficient without requiring external automated exchange mechanisms. This self-service approach reduces complexity by utilizing existing components for multiple purposes.

Inventive Principle:
Principle #25Self-service

4Device complexity

If probe arm length is not automatically recognized, then the system remains simple, but incorrect measuring range settings lead to collision risks and damaged apparatus

Engineering Contradiction:
Improvesystem simplicityVSAvoidcollision prevention
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The system performs preliminary measurement of the angular deflection immediately after probe arm exchange before actual measurement begins. This preliminary action automatically determines the probe arm length and sets the correct measuring range in advance, preventing collision risks before they can occur during measurement operations.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS11255653B2Method for operating a surface measurement apparatus
Publication Date: 2022.02.22 JENOPTIK IND METROLOGY GERMANY
  • US11255653B2 patent drawing
  • US11255653B2 patent drawing

AI summary

A method for operating a surface measuring apparatus for measuring a surface of a workpiece. Method includes operating surface measuring apparatus having a probe that includes a probe arm that is deflectable by an angle about a swivel axis, and that on its end facing away from the swivel axis bears a probe element. Probe is movable relative to a base body of surface measuring apparatus along a linear axis. In method, a workpiece is contacted by moving the probe along the linear axis by use of the probe element, and after workpiece is contacted, probe arm is moved by a specified travel distance along the linear axis. The resulting angular deflection of the probe arm about the swivel axis is measured, and based on the specified travel distance and measured angular deflection of the probe arm, the probe arm is classified with regard to its length.