Probe Array With Uniform Guide Plate Dimensions

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Solution Overview

Problem

Existing probe structures struggle to simultaneously perform multiple testing purposes due to differences in dimensions, leading to unstable contact forces, difficulty in adjusting distances, and challenges in temperature control during testing.

Innovation Solution

A probe array design featuring probe structures with the same end portions but different shapes, allowing for the same cross-sectional areas at both ends, enabling the use of the same guide plate dimensions for structures of varying sizes and shapes.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If probe structures of different dimensions are arranged in the same probe array to fulfill different testing purposes, then multiple testing purposes can be achieved, but the openings of the guide plates cannot have equal dimensions, leading to unstable testing

Engineering Contradiction:

Improvetesting purposesVSAvoidcontact forces stability

Core Design Contradiction:

Adaptability or versatilityVSReliability

Solution Approach 1:

The probe structures are designed with different internal configurations (thick vs. thin) while maintaining the same external dimensions and guide plate opening sizes. This local differentiation allows different testing capabilities (high-current vs. high-frequency) without compromising the uniformity of contact forces, as the guide plate openings remain equal in dimension.

Inventive Principle:

Principle #3Local quality

2Adaptability or versatility

If probe structures of different dimensions are used for different testing purposes, then testing versatility is improved, but difficulty in adjusting distances between probe structures occurs

Engineering Contradiction:

Improvetesting purposesVSAvoiddistance adjustment

Core Design Contradiction:

Adaptability or versatilityVSEase of operation

Solution Approach 1:

Different probe structures have different internal thicknesses to serve different testing purposes, but they all share the same external dimensions. This ensures that the distance between probe structures can be uniformly adjusted using the same guide plate openings, eliminating the complexity of accommodating varying dimensions.

Inventive Principle:

Principle #3Local quality

3Adaptability or versatility

If probe structures of different dimensions are arranged in the probe array, then multiple testing functions are achieved, but difficulty in controlling temperatures during testing occurs

Engineering Contradiction:

Improvetesting functionsVSAvoidtemperature control

Core Design Contradiction:

Adaptability or versatilityVSTemperature

Solution Approach 1:

The probe structures are designed with different internal configurations for different testing functions while maintaining uniform external dimensions. This uniformity in outer dimensions ensures consistent thermal contact with the object under test, enabling effective temperature control across all probe structures in the array.

Inventive Principle:

Principle #3Local quality

Data Source

PatentUS12210037B2Probe array and probe structure

Publication Date: 2025.01.28 XINGR HOLDINGS PTE LTD

AI summary

The present disclosure provides a probe array and a probe structure. The probe array includes a first probe structure and a second probe structure. The first probe structure includes a first body having a first end and a second end. The second probe structure includes a second body having a first end and a second end. The first end of the first body and the first end of the second body have a same sectional area on a first section. The second end of the first body and the second end of the second body have a same sectional area on a second section. The first body and the second body have different shapes.