Probe Assembly for Lapping Bar Using Patterned Electrode Pad
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Solution Overview
Problem
Conventional methods for lapping bars with MR elements face issues such as damage from electrostatic discharge, contamination, and increased lead time due to wire bonding, as well as difficulties in precise positioning and excessive force application with needle-shaped terminals or probes.
Innovation Solution
A probe assembly with an elastically deflectable probe and a stopper that applies controlled bending deformations to establish contact with electrode pads without axial force, minimizing damage and facilitating precise positioning, while avoiding wire bonding and reducing the risk of electrostatic discharge.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If wire bonding is used to connect the probe to the electrode pad, then electrical connection is established, but the electrode pad may be damaged during wire attachment or removal, and operation time increases
Solution Approach 1:
The patent extracts the harmful wire bonding process entirely and replaces it with a direct probe-to-electrode pad contact method. The probe assembly makes electrical connection by pressing the probe tip directly against the electrode pad surface, eliminating wire attachment and removal operations that cause damage and time loss.
Solution Approach 2:
The patent replaces the mechanical wire bonding system with a simplified mechanical contact system where the probe tip directly contacts the electrode pad. This substitution eliminates the complex wire attachment process while maintaining electrical connection functionality.
2Reliability
If a needle-shaped terminal is pressed against the electrode pad, then electrical connection is established, but the needle is easily bent due to axial force, making positioning difficult
Solution Approach 1:
Instead of pressing the probe tip axially against the electrode pad (conventional method), the patent inverts the approach by having the probe approach from behind the bar and contact the electrode pad from the opposite side. This eliminates axial bending forces on the probe while maintaining electrical connection.
Solution Approach 2:
The patent introduces the bar itself as an intermediary medium. The probe contacts the electrode pad from behind the bar, using the bar structure to support and position the probe, thereby eliminating the need for precise direct positioning of the probe tip against the pad front surface.
3Reliability
If a probe is pressed against the bar from the front to contact the electrode pad, then electrical connection is established, but excessive pressing force is easily applied to the pad and precise position control is required
Solution Approach 1:
The patent inverts the probing direction by contacting the electrode pad from behind the bar rather than from the front. This reversal allows the probe to approach the pad at a more favorable angle and with more controlled force, reducing the risk of excessive pressing force and simplifying position control requirements.
4Reliability
If wire bonding is used for connection, then electrical connection is established, but electrostatic discharge may damage the electrode pad and contamination may occur
Solution Approach 1:
The patent extracts and eliminates the wire bonding process entirely from the system. By using direct probe-to-electrode pad contact, the patent removes the wire as an intermediate element that could accumulate static charge or introduce contamination, thereby eliminating these harmful factors.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution provides a probe assembly that reduces contamination and lead time, ensures precise positioning, and maintains a simple, cost-effective structure, allowing for accurate lapping control with reduced risk of damage to the probe and electrode pads.
Implementation Method 1
an elastically deflectable probe, and a stopper for applying bending deformation to the probe so as to cause first bending deflection at a leading end of the probe and for maintaining the first bending deflection of the leading end
Data Source
AI summary
A probe assembly used to lap a bar, the bar being provided with elements that are to be formed into sliders, is provided. The probe assembly comprises an elastically deflectable probe, and a stopper for applying bending deformation to the probe so as to cause first bending deflection at a leading end of the probe and for maintaining the first bending deflection of the leading end while preventing a bending deformation at the leading end from becoming smaller than the first bending deflection. The leading end of the probe is adapted to be subjected to second bending deflection that is larger than the first bending deflection in a same direction as a direction of the first bending deflection and thereby to abut against an electrode pad to establish electrical connection between the probe and the electrode pad, the electrode pad being provided on a surface of the bar other than a surface to be lapped.