Probe Assembly with Two Spaced Probes for High Frequency Circuit Testing

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Solution Overview

Problem

Conventional probe assemblies face difficulties in testing high frequency circuits due to limitations in probe spacing and orientation adjustments.

Innovation Solution

A probe assembly with moveable two-pin probe mounting block assemblies, motor encoder assemblies for precise X, Y, and Z direction movement, and a camera for selecting pin locations, enabling accurate positioning and signal transmission for high frequency circuit testing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional probe assemblies are used with fixed or mechanically adjustable probe spacing, then the device complexity is reduced, but the measurement precision and adaptability for high frequency circuits deteriorate

Engineering Contradiction:
Improvetesting accuracy for high frequency circuitsVSAvoidprobe assembly structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The probe assembly incorporates motor encoder assemblies that enable dynamic, programmable adjustment of probe spacing and orientation. The mounting block assemblies can be moved in controlled fashion along the probe shaft, allowing the system to adapt to different circuit board configurations and high frequency testing requirements, transforming a static mechanical system into a dynamic, controllable one.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent replaces traditional manual mechanical adjustment mechanisms with motor encoder assemblies that provide automated, precise positioning. The motor encoders enable electronic control of probe spacing and orientation, substituting manual mechanical operations with automated electromechanical systems that achieve higher precision and repeatability required for high frequency circuit testing.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Adaptability or versatility

If two probes are made mechanically adjustable for different spacings and orientations, then the adaptability improves, but the reliability and measurement precision for high frequency circuits deteriorate

Engineering Contradiction:
Improveprobe spacing and orientation adjustmentVSAvoidtesting consistency for high frequency circuits
Core Design Contradiction:
Adaptability or versatilityVSReliability

Solution Approach 1:

The motor encoder assemblies replace manual mechanical adjustment mechanisms with automated, electronically controlled positioning systems. This substitution ensures repeatable, precise movements that maintain consistent probe spacing and orientation, thereby improving reliability and measurement consistency for high frequency circuit testing while preserving adaptability through programmable control.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The motor encoder assemblies incorporate feedback mechanisms that precisely track and report the position of mounting block assemblies. This feedback enables the control system to verify and maintain accurate probe positioning, ensuring consistent spacing and orientation across multiple measurements and different circuit board configurations, thus improving both adaptability and reliability.

Inventive Principle:
Principle #23Feedback

3Measurement precision

If fixed probe spacing is used in conventional test apparatus, then the device complexity is reduced, but the measurement precision for high frequency circuits deteriorates

Engineering Contradiction:
Improvesignal reception accuracyVSAvoidmoveable probe mounting system
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The probe mounting block assemblies are designed to be moveable along the probe shaft through motor encoder assemblies, transforming a fixed spacing system into a dynamic one. This enables precise adjustment of probe spacing to optimize signal reception for high frequency circuits, with the moveability controlled through programmed sequences that manage the increased system complexity.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS11674979B2Probe assembly with two spaced probes for high frequency circuit board test apparatus
Publication Date: 2023.06.13 HUNTRON INC
  • US11674979B2 patent drawing
  • US11674979B2 patent drawing
  • US11674979B2 patent drawing

AI summary

The probe assembly operates with a circuit board test apparatus and includes a main test probe and a secondary test probes. The probe assembly is capable of moving in X, Y and Z directions relative to a circuit board being tested (UUT). The two test probes are movable linearly relative to each other and rotatable together so as to accurately locate the two probes on selected pins on the UUT, for receiving signals from the selected pins, The received signals are transmitted to a display apparatus.