Configurable Probe Bar for Flat Panel Display Inspection
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional electrical inspection systems for small LCD panels require additional real estate due to the use of shorting bars, leading to significant panel losses and reduced throughput, making it challenging to manage production yields effectively.
Innovation Solution
A probe system with a configurable probe bar and alignment system that allows simultaneous electrical engagement of cell contact pads without shorting bars, utilizing spring-loaded pogo pins and a precision tooling plate for accurate alignment, enabling high-throughput inspection of small panels without additional real estate loss.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If shorting bars are used to facilitate probing of panels for array test, then the probing assembly is simplified, but panel real estate is reduced by 15-20%
Solution Approach 1:
The patent removes the shorting bar component from the probing system entirely. Instead of using shorting bars to simplify probing, the invention directly probes individual contact pads on the panel using a configurable probe bar with multiple independently controllable probe elements, eliminating the need for shorting bars and their associated real estate requirements.
Solution Approach 2:
The probe bar is divided into multiple independently controllable probe elements that can be individually positioned and activated. This segmentation allows each probe element to target specific contact pads without requiring shorting bars to group connections, thereby maintaining probing functionality while reducing panel real estate consumption.
2Ease of operation
If shorting bars are implemented to reduce the number of contacts needed, then the probing assembly is simplified, but glass utilization is significantly reduced
Solution Approach 1:
The probe bar incorporates dynamically adjustable probe elements that can be positioned and configured based on the specific panel layout being tested. This dynamic adaptability eliminates the need for static shorting bar configurations, allowing simplified probing operations without sacrificing glass utilization.
Solution Approach 2:
The system changes the operational parameters of the probing process by using individually addressable probe elements with adjustable positions and activation states. This allows the system to maintain ease of operation through automated control while avoiding the real estate penalty of shorting bars.
3Productivity
If conventional probing methods with shorting bars are used, then inspection throughput is limited, but 100% inspection of small panels is not achieved
Solution Approach 1:
The system performs preliminary configuration of the probe bar to match the specific panel layout before inspection begins. This preliminary setup enables immediate high-throughput inspection without the need for shorting bars, achieving both 100% inspection capability and maintained productivity.
Solution Approach 2:
The configurable probe bar serves multiple functions: it can be adapted to different panel sizes, contact pad layouts, and inspection requirements. This universality allows the system to achieve 100% inspection of small panels while maintaining high throughput, eliminating the need for separate shorting bar infrastructure.
Data Source
AI summary
A probe system for facilitating inspection of a device under test comprising a plurality of panels, the probe system incorporating: a configurable universal probe bar comprising a plurality of probe blocks, the plurality of probe blocks comprising a plurality of probe pins positioned to simultaneously electrically engage a plurality of cell contact pads of the plurality of panels of the device under test to deliver a plurality of electrical test signals; and an alignment system configured to achieve an alignment of the plurality of probe pins with the plurality of the cell contact pads of the plurality of panels of the device under test.