Probe Base Plate Flatness Control via Pre-Deformation
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Solution Overview
Problem
Conventional electrical connecting apparatuses require complex and skillful adjustments to maintain probe tip flatness, especially as the number of probes increases, and struggle with maintaining stability over time, particularly during the enlargement of devices under test.
Innovation Solution
An electrical connecting apparatus that incorporates a spacer to maintain the deformation of the probe base plate, allowing probes to align on the same plane without the need for post-attachment flatness adjustments, and simplifies assembly by allowing the spacer and screw member to be inserted from the same side, reducing the complexity and cost of manufacturing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If conventional adjustment methods are used to maintain probe tip flatness, then electrical contact can be achieved, but the adjustment process becomes complicated and requires skill, especially as the number of probes increases
Solution Approach 1:
The probe base plate is pre-deformed during manufacturing to compensate for expected bending deformation. This preliminary action eliminates the need for complex post-assembly adjustments, as the plate is already configured to maintain probe tip flatness when installed on the supporting member.
Solution Approach 2:
The adjustment function is extracted from the assembly process and incorporated into the probe base plate manufacturing process. By pre-deforming the plate during manufacturing rather than adjusting it during assembly, the complex adjustment process is eliminated.
2Productivity
If the probe base plate is enlarged to accommodate more probes, then testing capacity increases, but maintaining flatness becomes more difficult with conventional adjustment methods
Solution Approach 1:
The probe base plate is pre-deformed during manufacturing to compensate for expected bending deformation. This preliminary action eliminates the need for complex post-assembly adjustments, as the plate is already configured to maintain probe tip flatness when installed on the supporting member.
3Reliability
If conventional adjustment methods are used, then initial electrical contact can be established, but flatness stability deteriorates over time
Solution Approach 1:
The probe base plate is pre-deformed during manufacturing to compensate for expected bending deformation. This preliminary action eliminates the need for complex post-assembly adjustments, as the plate is already configured to maintain probe tip flatness when installed on the supporting member.
Data Source
AI summary
An electrical connecting apparatus for use in electrical measurement of a device under test comprises a supporting member and a flat plate-like probe base plate. On one surface of the probe base plate are provided multiple probes abutting on electrical connecting terminals of the device under test undergoing an electrical test. Also, on the other surface of the probe base plate is formed a securing portion provided with a screw hole opened at the top portion. It further has a generally cylindrical spacer and a screw member passing through the spacer and whose tip end is screwed in the screw hole of the securing portion. As for the spacer, movement in the axial direction is restricted in relation to the supporting member by a restricting means. The spacer has a head portion whose underside is mounted on the other surface of the supporting member and a body portion communicating with the head portion at one end, arranged to pass through a through hole formed in the supporting member, and whose other end is arranged to abut on the top face of the securing portion.