Probe Calibration Using Perpendicular Microstrip Lines
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Solution Overview
Problem
Current calibration methods for electric and magnetic field probes only consider the coupling with the main field component, ignoring unwanted coupling with space electric or magnetic fields, which affects the accuracy of probe calibration and noise suppression.
Innovation Solution
A calibration system and method using a microstrip line assembly with perpendicular microstrip lines on different routing layers, a clamp, and a vector network analyzer to measure and calculate comprehensive calibration factors, including coupling coefficients between electric and magnetic fields, to accurately determine the probe's coupling ability and noise suppression capabilities.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If only the coupling with the main field component is considered during calibration, then the calibration process is simple, but the calibration accuracy deteriorates due to ignoring unwanted coupling with space electric or magnetic fields
Solution Approach 1:
The patent segments the calibration process into two distinct stages: first calibrating the probe for the main field component using a single microstrip line, then calibrating for the unwanted coupled field component using a second microstrip line oriented perpendicularly. This segmentation allows comprehensive calibration without overwhelming complexity, as each stage focuses on a specific field component.
Solution Approach 2:
The patent introduces a second dimension to the calibration process by adding a second microstrip line perpendicular to the first one. This dimensional expansion enables the system to measure and compensate for unwanted coupling effects that exist in orthogonal field directions, thereby improving calibration accuracy.
2Reliability
If a single microstrip line is used for calibration, then the calibration method is simple, but the ability to evaluate noise suppression is insufficient
Solution Approach 1:
The calibration system is segmented into two functional components: the first microstrip line for main field calibration and the second microstrip line for unwanted field calibration. This segmentation enables independent evaluation of the probe's response to different field components, providing comprehensive noise suppression assessment.
Solution Approach 2:
The second microstrip line acts as an intermediary element that specifically generates the unwanted coupled field component. By using this intermediary structure, the patent enables separate measurement and evaluation of the probe's noise suppression capability without interfering with the main field calibration.
3Measurement precision
If unwanted field coupling is ignored, then the calibration calculation is straightforward, but the probe factor accuracy deteriorates
Solution Approach 1:
The patent segments the field coupling measurements into two separate calibration processes: one for the main field component and another for the unwanted coupled field component. This segmentation simplifies the measurement complexity by handling each field component independently, while still achieving accurate probe factor calculation that accounts for both couplings.
Solution Approach 2:
By introducing a second calibration dimension with the perpendicular microstrip line, the patent enables measurement of previously unmeasured field coupling effects. This additional dimensional measurement provides the data needed to calculate accurate probe factors that compensate for unwanted coupling.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances the accuracy of probe calibration by considering both main and non-to-be-measured field couplings, allowing for comprehensive measurement of sensitivity and noise suppression, improving the reliability of electromagnetic near-field scanning.
Implementation Method 1
the field generated during its operation is the field of standard transverse electromagnetic wave
Implementation Method 2
the output of the magnetic field probe only depends on the coupling of the magnetic field probe with the magnetic field radiated by the standard microstrip line
Data Source
AI summary
The present application discloses calibration system and method for an electric field probe and a magnetic field probe based on multiple components. The system includes a microstrip line calibration assembly, a clamp, a vector network analyzer and a data processing unit; two groups of microstrip lines included in the microstrip line calibration assembly can be distributed on different routing layers of the same PCB board or on independent PCB boards; the first group of microstrip lines is single microstrip lines or differential lines under common mode excitation, which are used to generate a main component Hy of a magnetic field, and the second group of microstrip lines is differential lines under differential mode excitation, which are used to generate a main component Ex of an electric field.