Probe Card with Bent Probes for Irregular Electrode Contact
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional probe cards struggle to establish a one-to-one contact with electrodes in electronic devices having multiple rows with varying pitches and positions, leading to potential probe contact issues during electrical testing.
Innovation Solution
A probe card design featuring multiple probe groups with uniquely bent probe tips and alternating arrangements to avoid contact between adjacent probes, allowing for reliable contact with electrodes in electronic devices having irregularly arranged electrodes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If probes are arranged with uniform pitch to match electrode positions in conventional probe cards, then probe alignment with electrodes is simplified, but probes cannot contact all electrodes in electronic devices with varying electrode pitches across multiple rows
Solution Approach 1:
The probe card divides probes into multiple groups (first group, second group, third group, fourth group) with different orientations and positions. Each group is segmented to contact specific rows of electrodes, allowing the system to handle varying electrode pitches across different rows while maintaining uniform probe pitch within each group.
Solution Approach 2:
The probe card employs asymmetric probe arrangements where probes in different groups have different orientations (some extending to the right side, others to the left side). This asymmetry allows probes to adapt to electrodes with varying pitches and positions across multiple rows, resolving the contradiction between uniform probe pitch and variable electrode pitch requirements.
2Adaptability or versatility
If probes are arranged to contact electrodes in electronic devices with reduced pitch and multiple rows, then testing capability is improved, but adjacent probes may contact each other
Solution Approach 1:
The probe card utilizes spatial arrangement in multiple dimensions by positioning probes in different groups at different locations and orientations. Probes are arranged not only in rows but also distributed across different groups with alternating orientations, creating sufficient spatial separation that prevents adjacent probes from contacting each other while still enabling comprehensive electrode coverage.
Solution Approach 2:
The probe card employs curved or bent probe configurations where probe main body portions extend in different directions (right side for some probes, left side for others). This curvature and directional variation allows probes to reach electrodes with reduced pitch without requiring linear close spacing, thereby preventing probe-to-probe contact while maintaining electrode contact capability.
3Ease of manufacture
If conventional probe cards use uniform probe pitch, then manufacturing is simplified, but they cannot accommodate electronic devices with irregularly arranged electrodes in multiple rows
Solution Approach 1:
The probe card segments probes into multiple groups with different orientations and positions. Each group can be manufactured with uniform probe pitch, maintaining manufacturing simplicity, while the collective arrangement of all groups provides the adaptability needed to contact irregularly arranged electrodes across multiple rows.
Solution Approach 2:
The probe card design creates a universal testing solution where the multi-group probe arrangement can accommodate various electrode configurations (different pitches, multiple rows, irregular positions) while maintaining uniform probe pitch within each group. This multi-functional arrangement allows a single probe card design to test different electronic device variants.
Data Source
AI summary
The probe card includes a plurality of probes arranged on one surface side of a board. These probes belonging to any one of a first probe group including a plurality of probes contacting respective electrodes in a first electrode row of an electronic device, a second probe group including a plurality of probes contacting respective electrodes in a second electrode row of the electronic device, and a third and fourth probe groups respectively including a plurality of probes contacting respective electrodes in a middle electrode row of the electronic device alternately.