Probe Card Conductive Probe Capacitance Effect PDN Impedance
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Solution Overview
Problem
Conventional probe card devices experience increased power delivery network impedance during high-speed signal transmission, leading to signal distortion and performance issues.
Innovation Solution
The probe card device incorporates conductive probes with a metallic pin, outer electrode, and dielectric layer, where the metallic pin and outer electrode are separated by the dielectric layer to create a capacitance effect, allowing the probes to be immediately coupled to a capacitor, thereby maintaining signal integrity and reducing power impedance at resonant frequencies.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional probe card device is used for high-speed signal transmission, then signal transmission capability is required, but power delivery network impedance increases causing signal distortion
Solution Approach 1:
The conductive probe is segmented into multiple functional parts: metallic pin for signal contact, outer electrode for capacitance generation, and dielectric layer for insulation. This segmentation allows each component to perform its specific function optimally, with the outer electrode and dielectric layer creating a capacitance effect that compensates for PDN impedance without affecting the signal transmission path
Solution Approach 2:
The outer electrode and dielectric layer act as an intermediary capacitance structure between the metallic pin and the grounding sheet. This intermediary capacitance effect compensates for the PDN impedance by providing a local charge storage mechanism that maintains signal integrity during high-speed transmission
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration effectively maintains high-speed signal transmission integrity and reduces power impedance, improving the performance of the power delivery network.
Implementation Method 1
the outer electrode, a part of the dielectric layer connected to the outer electrode, and a part of the metallic pin connected to the part of the dielectric layer are jointly configured to generate a capacitance effect
Data Source
AI summary
The present disclosure provides a probe card device and a conductive probe thereof. The conductive probe includes a metallic pin, an outer electrode, and a dielectric layer. The metallic pin includes a middle segment, a first connecting segment and a second connecting segment respectively extending from two opposite ends of the middle segment, and a first contacting segment and a second contacting segment respectively extending from the first connecting segment and second contacting segment along two opposite directions away from the middle segment. At least part of the outer electrode corresponds in position to the middle segment and is arranged adjacent to the first connecting segment. The dielectric layer is sandwiched between and entirely separates the metallic pin and the outer electrode, so that the outer electrode, the dielectric layer, and the metallic pin are jointly configured to generate a capacitance effect.